Contrast and Raman spectroscopy study of single- and few-layered charge density wave material: 2H-TaSe 2

Parviz Hajiyev,Chunxiao Cong,Caiyu Qiu,Ting Yu
DOI: https://doi.org/10.1038/srep02593
IF: 4.6
2013-01-01
Scientific Reports
Abstract:In this article, we report the first successful preparation of single- and few-layers of tantalum diselenide (2H-TaSe 2 ) by mechanical exfoliation technique. Number of layers is confirmed by white light contrast spectroscopy and atomic force microscopy (AFM). Vibrational properties of the atomically thin layers of 2H-TaSe 2 are characterized by micro-Raman spectroscopy. Room temperature Raman measurements demonstrate MoS 2 -like spectral features, which are reliable for thickness determination. E 1g mode, usually forbidden in backscattering Raman configuration is observed in the supported TaSe 2 layers while disappears in the suspended layers, suggesting that this mode may be enabled because of the symmetry breaking induced by the interaction with the substrate. A systematic in-situ low temperature Raman study, for the first time, reveals the existence of incommensurate charge density wave phase transition in single and double-layered 2H-TaSe 2 as reflected by a sudden softening of the second-order broad Raman mode resulted from the strong electron-phonon coupling (Kohn anomaly).
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