Suppression of charge carrier recombination in a Ta3N5 photoanode via defect regulation: a theoretical investigation

Guozheng Fan,Zhaobo Zhou,Jing Yu,Thomas Frauenheim
DOI: https://doi.org/10.1039/d4ta01693a
IF: 11.9
2024-05-30
Journal of Materials Chemistry A
Abstract:Defect-induced charge carrier recombination in a photoanode significantly restricts the efficiency of solar-driven water splitting. By systematically investigating the photoexcited charge carrier recombination dynamics of Ta 3 N 5 with intrinsic defects, charge states, oxygen (O) impurities, and metal doping based on density functional theory (DFT) calculations and nonadiabatic molecular dynamics (NAMD) simulations, we propose two strategies to mitigate defect-induced charge carrier recombination: ionizing nitrogen (N) vacancies and magnesium (Mg) doping. Our results show that tantalum (Ta) reduction induced by N vacancies is the primary factor in reducing the carrier lifetime of the Ta 3 N 5 photoanode. Ionizing N vacancies and Mg doping can tune the charges of reduced Ta species near the N vacancies, thus extending the recombination lifetime. By contrast, charge-balanced metal and O impurities co-doping in Ta 3 N 5 photoanodes cannot significantly increase the lifetime. Our investigation sheds new light on understanding the charge carrier recombination mechanism and provides dependable strategies to improve the water-splitting performance of the Ta 3 N 5 photoanode.
materials science, multidisciplinary,chemistry, physical,energy & fuels
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