Development of pixelated silicon detector for AMS study

Fuyuki Tokanai,Toru Moriya,Mirei Takeyama,Kosaku Kuramoto,Kouji Morimoto,Daiya Kaji,Kentaro Nakamura,Shigeru Itoh,Kazumasa Kosugi
DOI: https://doi.org/10.1016/j.nimb.2024.165353
2024-04-17
Abstract:A pixelated silicon detector (PSD) has been developed for the position-sensitive detector on a focal plane of an accelerator mass spectrometry (AMS) system in Yamagata University (YU). The YU-AMS system measures the relative abundances of the carbon isotopes 14 C, 13 C, and 12 C for radiocarbon dating. The beam of the rare isotope 14 C is transported to the focal plane of the AMS system. When the focal plane detector is position-sensitive to the beam, it can be utilized for beam diagnostics on the AMS beamline to achieve 14 C measurement with high accuracy. To investigate the characteristics of the PSD, α particles from 241 Am were irradiated on the PSD. A beam test using 14 C was also performed to evaluate the size and position of the 14 C beam on the focal plane of the YU-AMS system.
physics, nuclear, atomic, molecular & chemical,nuclear science & technology,instruments & instrumentation
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