A Comprehensive BRF Model for SpectralonR and Application to Hyperspectral Field Imagery

Chris H. Lee,Charles M. Bachmann,Nayma Binte Nur,Yiwei Mao,David N. Conran,Timothy D. Bauch
DOI: https://doi.org/10.1109/tgrs.2024.3361392
IF: 8.2
2024-02-16
IEEE Transactions on Geoscience and Remote Sensing
Abstract:We present a comprehensive hyperspectral bi-directional reflectance model for a pristine optical-grade white Spectralon panel with full azimuthal coverage, a wide range of view zenith angles, and incident illumination zenith angles, throughout ultraviolet (UV), visible near-infrared (VNIR), and shortwave infrared (SWIR) wavelengths (350–2500 nm). Measurements were acquired using the Goniometer of the Rochester Institute of Technology-Two (GRIT-T), which incorporates Analytical Spectral Device (ASD) FieldSpec Full-Range 4 (FR4) spectroradiometers. Residual plots show that the empirical model is accurate to within 1%–2% reflectance within most of the observing hemisphere. We demonstrate an application of the Spectralon panel model to hyperspectral imagery (HSI) acquired during a field experiment at the RIT Tait Preserve where a pair of field Spectralon panels was imaged from various view geometries from both drone and mast-mounted hyperspectral imaging systems.
imaging science & photographic technology,remote sensing,engineering, electrical & electronic,geochemistry & geophysics
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