In Situ Self-Fluorescence 3D Imaging of Micro/Nano Damage in Silicone Gel for Understanding Insulation Failure under High-Frequency Electric Fields

Xinyu Tang,Wenxia Sima,Potao Sun,Chun Zun,Tao Yuan,Ming Yang,Zeyan Shi,Haoyue Yang,Qin Deng
DOI: https://doi.org/10.1021/acsami.3c12047
IF: 9.5
2023-11-09
ACS Applied Materials & Interfaces
Abstract:Strong electromagnetic and heat flux stresses can induce severe damage to solid insulation materials, leading to faults in power equipment and power electronics devices. However, in the absence of suitable in situ imaging methods for observing the development and morphology of electrical damage within insulation materials, the mechanism of insulation failure under high-frequency electric fields has remained elusive. In this work, a recently discovered fluorescence self-excitation phenomenon in...
materials science, multidisciplinary,nanoscience & nanotechnology
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