Growth and characterization of pyrochlore-type (Ca,Ti)<sub>2</sub>(Nb,Ti)<sub>2</sub>O<sub>7</sub> thin films
Jing-Wei Yin,Yan Wang,Yue-Hua Chen,Sheng-Qiang Wu,Shao-Dong Cheng,Shao-Bo Mi,Lu Lu,Lei Jin,Hong Wang
DOI: https://doi.org/10.1016/j.tsf.2021.138546
IF: 2.1
2021-01-01
Thin Solid Films
Abstract:Pyrochlore-type (Ca,Ti)(2)(Nb,Ti)(2)O-7 thin films have been grown on single-crystalline LaAlO3 and yttria-stabilized zirconia substrates by a magnetron sputtering system. Atomic-scale interface structure and growth mode of the (Ca,Ti)(2)(Nb,Ti)(2)O-7 films on the substrates with different crystal structures have been investigated by advanced electron microscopy techniques. In both hetemsystems, the film/substrate orientation relationship of [100] (001)(film)//[100](001)(substrate )has been determined. In the heterosystem of (Ca,Ti)(2)(Nb,Ti)(2)O-7/yttria-stabilized zirconia, the films directly grow on the substrates. In contrast, in the (Ca,Ti)(2)(Nb,Ti)(2)O-7/LaAlO3 hetemsystem, a perovskite-type Ca1-square(Ti,Nb)O-3 interlayer with a few unit cells in thickness forms at the interface and interfacial reconstruction occurs at the (Ca,Ti)(2)(Nb,Ti)(2)O-7/Ca1-square(Ti,Nb)O-3 interface. Our findings indicate that the formation of the interlayer and the (Ca,Ti)(2)(Nb,Ti)(2)O-7/Ca1-square(Ti,Nb)O-3 interface reconstruction can accommodate the film/substrate dissimilarities in the crystal structures and facilitate the growth of single-crystalline pyrochlore-type films on the perovskite-type substrates.