Abstract:All-perovskite tandem solar cells are attracting considerable interest in photovoltaics research, owing to their potential to surpass the theoretical efficiency limit of single-junction cells, in a cost-effective sustainable manner. Thanks to the bandgap-bowing effect, mixed tin-lead (Sn-Pb) perovskites possess a close to ideal narrow bandgap for constructing tandem cells, matched with wide-bandgap neat lead-based counterparts. The performance of all-perovskite tandems, however, has yet to reach...

What problem does this paper attempt to address?

The paper primarily explores the application of narrow-bandgap metal halide perovskites (especially tin-lead mixed types) in all-perovskite tandem photovoltaic devices and conducts an in-depth analysis of the reasons for their efficiency losses. The core aim of the paper is to address the following issues: 1. **Improving Perovskite Film Quality**: The paper emphasizes the major obstacle of low-quality tin-lead mixed perovskite films, which is due to the easy oxidation of tin(II) to tin(IV) and the challenging control of film crystallization dynamics. 2. **Improving Surface Defects**: Due to the aforementioned reasons, a large number of structural defects appear in the perovskite films, especially at the film surface, top and bottom interfaces, and grain boundaries. These defects severely affect device performance, making the actual efficiency far below the theoretical maximum. 3. **Optimizing All-Perovskite Tandem Photovoltaic Devices**: To achieve efficient and reliable all-perovskite double-junction or multi-junction tandem photovoltaic devices, the issue of integrating narrow-bandgap sub-cells needs to be addressed. The paper reviews existing research work and discusses in detail several major reasons for efficiency loss, including: - **Crystallization Process**: Suboptimal crystallization conditions lead to decreased film quality and the creation of non-radiative recombination pathways. - **Oxidation**: Tin(II) is easily oxidized, which not only reduces film quality but may also introduce self-doping effects. - **Quality Loss**: The loss of perovskite crystal lattice ions leads to significant degradation in device performance. - **Ion Migration**: Ion migration in perovskite films causes current loss over time, thereby affecting device stability. The paper also proposes several improvement measures, such as surface engineering techniques and 2D capping strategies, to mitigate these issues. Additionally, the paper looks forward to future research directions, emphasizing the importance of characterizing specific surface defects and tracking their evolution under external stimuli, which is crucial for developing efficient single-junction and tandem solar cells.

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