Method and Equipment for Reducing the Efficiency Degradation of Monocrystalline Passivated Emitter and Rear Cells

Weitao Fan,Honglie Shen,Xin Zhang,Hong Pan
DOI: https://doi.org/10.3390/en17071550
IF: 3.2
2024-03-24
Energies
Abstract:Infrared soldering as a step in module encapsulation, which would cause light-induced degradation (LID) and light- and elevated-temperature-induced degradation (LeTID) effects on solar cells, may cause efficiency mixing among solar cells that were originally in the same grade within the module after soldering. Furthermore, the problem of bright and dark regions would appear, which would result in a decrease in the CTM value. Current injection is considered to be one of the effective methods to solve the above problem. However, after the current injection treatment, there is still a 10% probability of the appearance of bright and dark regions in modules. In this work, we first adopted the conventional current injection process in monocrystalline passivated emitter and rear cells (PERCs). The effects of injected currents, temperature and time were systematically optimized, and cells with or without the current injection under the optimal parameters were illuminated with 1 sun at 85 °C for 25 h. Secondly, a piece of equipment was developed to further stabilize the performance of solar cells and improve the CTM value. The results showed that the best current injection parameters were a temperature of 185 °C, an injected current of 11 A and an injection time of 770 s. Compared with the cells without any pretreatment, the relative changes in the η, Voc, Isc and FF of the cells pretreated with the optimal conditions mentioned above were 0.23%, 0.08%, 0.02% and 0.08% larger, respectively, after 25 h of degradation. Then, solar cells processed by current injection were processed with our equipment, and the probability of a problem occurring was reduced from 10% to 2%. Meanwhile, the CTM value increased by 0.4%. Finally, a balance mechanism between H0 and H0-X has been proposed to explain the mechanism of the equipment.
energy & fuels
What problem does this paper attempt to address?
The paper attempts to address the issue of light-induced degradation (LID) and light and elevated temperature-induced degradation (LeTID) effects caused by infrared welding during the solar cell encapsulation process. These effects can lead to efficiency differences in solar cells of the same grade after welding and result in bright and dark area phenomena, thereby reducing the cell-to-module (CTM) efficiency ratio. Specifically, the paper proposes the following two steps to solve this problem: 1. **Current Injection Treatment**: First, the traditional current injection process is used to treat monocrystalline passivated emitter and rear cell (PERC) solar cells. By systematically optimizing the injection current, temperature, and time parameters, the optimal current injection parameters (11 A, 185°C, 770 seconds) are determined. Under these conditions, the cells pre-treated with current injection exhibit minimal efficiency loss after light-induced degradation. 2. **Equipment Development**: To further reduce the probability of bright and dark area occurrence and improve the CTM value, a new device was developed. This device simulates the infrared welding process, allowing the cells pre-treated with current injection to undergo accelerated degradation and regeneration processes in advance, thereby avoiding efficiency differences during actual welding. Experimental results show that after using this device, the probability of bright and dark area occurrence decreased from 10% to 2%, and the CTM value increased by 0.4%. In summary, the paper aims to effectively mitigate the efficiency degradation issue during the solar cell encapsulation process and enhance overall performance through current injection treatment and the application of new equipment.