Thickness-Dependent Dielectric Screening in Few-Layer Phosphorus

Chengxiang Chen,Zhenyu Wang,Bo Zhang,Zixuan Zhang,Jinying Zhang,Yonghong Cheng,Kai Wu,Jun Zhou
DOI: https://doi.org/10.1021/acs.jpclett.3c00608
2023-05-24
Abstract:The dielectric screening plays a critical role in determining the fundamental electronic properties in semiconductor devices. In this work, we report a noncontact and spatially resolved method, based on Kelvin probe force microscopy (KPFM), to obtain the inherent dielectric screening of black phosphorus (BP) and violet phosphorus (VP) as a function of the thickness. Interestingly, the dielectric constant of VP and BP flakes increases monotonically and then saturates to the bulk value, which is...
chemistry, physical,physics, atomic, molecular & chemical,nanoscience & nanotechnology,materials science, multidisciplinary
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