Abstract:Journal Article From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging Get access Hua Guo, Hua Guo Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Liang Jin, Liang Jin Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Penghan Lu, Penghan Lu Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China Search for other works by this author on: Oxford Academic Google Scholar Zhangjie Wang, Zhangjie Wang Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China Search for other works by this author on: Oxford Academic Google Scholar Zhiwei Shan, Zhiwei Shan Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China Search for other works by this author on: Oxford Academic Google Scholar Benjamin Bammes, Benjamin Bammes Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Michael Spilman, Michael Spilman Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Robert Bilhorn Robert Bilhorn Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 343–344, https://doi.org/10.1017/S1431927615002512 Published: 23 September 2015

Scanning Electron Thermal Absorbance Microscopy for Light Element Detection and Atomic Number Analysis

Standardization and quantification of backscattered electron imaging in scanning electron microscopy

A novel nano-scale non-contact temperature measurement technique for crystalline materials

Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures

Quantitative Thermal Imaging of Single-Walled Carbon Nanotube Devices by Scanning Joule Expansion Microscopy.

Quantitative Evaluation of Local Permittivity of Semiconductor Nanomaterials Using Microwave Atomic Force Microscopy

Quantitative material analysis using secondary electron energy spectromicroscopy

Sub-microanalysis of Solid Samples with Near-Field Enhanced Atomic Emission Spectroscopy

Electron Thermal Microscopy

Application of Low Voltage in Quantitative Analysis by Energy Dispersive Spectrum (EDS)

Electron thermal effects and new techniques of microbeam analysis in SEM

Low-voltage single-atom electron microscopy with carbon-based nanomaterials

Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy

Contactless Scanning Near‐Field Optical Dilatometry Imaging at the Nanoscale

A Terahertz Confocal Microscope for Far-Field Thermal Radiation Detection and Near-Field Sub-Wavelength Imaging

Measurement of electron beam induced sample heating in SEM experiments

Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart–Thornley Detector Systems

From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging

Feasibility Study of Thin Film Surface Analysis Using Synchrotron Low-Angle Incidence Conversion Electron Mössbauer Spectroscopy

Scanning Cathodoluminescence Microscopy: Applications in Semiconductor and Metallic Nanostructures

Direct Observation Techniques Using Scanning Electron Microscope for Hydrothermally Synthesized Nanocrystals and Nanoclusters