Raman spectroscopy of a few layers of bismuth telluride nanoplatelets

Victor Carozo,Bruno R. Carvalho,Syed Hamza Safeer,Leandro Seixas,Pedro Venezuela,Mauricio Terrones,Syed Hamza Safeer,P. Venezuela
DOI: https://doi.org/10.1039/d3na00585b
IF: 5.598
2023-08-23
Nanoscale Advances
Abstract:Upon the variation of the number of layers, we can adjust the electronic and phonon properties of Bi Te crystals. Here, we report a Raman study with the aid of first-principles calculations on few-layered Bi Te systems ranging from 5 to 24~nm layer thickness using 1.92, 2.41 and 2.54~eV excitation energies. We examine how the frequency position, intensity and lineshape of the main Raman modes ( , , and ) behave upon the variation of the layer thickness and excitation energy. We observed a frequency dispersion on the number of layers of the main modes, indicating changes in the inter- and intra-layers interactions. A resonant Raman condition is reached for all modes for samples with 11 and 18~nm thickness because of van Hove singularities at the electronic density of states. Also, the Breit-Wigner-Fano line shape of the mode shows an increase of electron-phonon coupling for thick layers. These results suggest a relevant influence of numbers of layers on the Raman scattering mechanics in Bi Te systems.
materials science, multidisciplinary,nanoscience & nanotechnology,chemistry
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