Real‐time analysis of liquid jet sample delivery stability for an X‐ray free‐electron laser using machine vision

Jaydeep Patel,Adam Round,Raphael de Wijn,Mohammad Vakili,Gabriele Giovanetti,Diogo Filipe Monrroy Vilan e Melo,Juncheng E,Marcin Sikorski,Jayanth Koliyadu,Faisal H. M. Koua,Tokushi Sato,Adrian Mancuso,Andrew Peele,Brian Abbey

DOI: https://doi.org/10.1107/s1600576724009853

IF: 4.868

2024-11-25

Journal of Applied Crystallography

Abstract:This paper describes real‐time statistical analysis of liquid jet images for serial femtosecond crystallography (SFX) experiments at the European XFEL. This analysis forms one part of the automated jet realignment system for SFX experiments at the SPB/SFX instrument of the European XFEL.Automated evaluation of optical microscopy images of liquid jets, commonly used for sample delivery at X‐ray free‐electron lasers (XFELs), enables real‐time tracking of the jet position and liquid jet hit rates, defined here as the proportion of XFEL pulses intersecting with the liquid jet. This method utilizes machine vision for preprocessing, feature extraction, segmentation and jet detection as well as tracking to extract key physical characteristics (such as the jet angle) from optical microscopy images captured during experiments. To determine the effectiveness of these tools in monitoring jet stability and enhancing sample delivery efficiency, we conducted XFEL experiments with various sample compositions (pure water, buffer and buffer with crystals), nozzle designs and jetting conditions. We integrated our real‐time analysis algorithm into the Karabo control system at the European XFEL. The results indicate that the algorithm performs well in monitoring the jet angle and provides a quantitative characterization of liquid jet stability through optical image analysis conducted during experiments.

chemistry, multidisciplinary,crystallography