Characterizing Defects Inside Hexagonal Boron Nitride Using Random Telegraph Signals in van der Waals 2D Transistors

Zhujun Huang,Ryong-Gyu Lee,Edoardo Cuniberto,Jiyoon Song,Jeongwon Lee,Abdullah Alharbi,Kim Kisslinger,Takashi Taniguchi,Kenji Watanabe,Yong-Hoon Kim,Davood Shahrjerdi
DOI: https://doi.org/10.1021/acsnano.4c06929
IF: 17.1
2024-09-29
ACS Nano
Abstract:Single-crystal hexagonal boron nitride (hBN) is used extensively in many two-dimensional electronic and quantum devices, where defects significantly impact performance. Therefore, characterizing and engineering hBN defects are crucial for advancing these technologies. Here, we examine the capture and emission dynamics of defects in hBN by utilizing low-frequency noise (LFN) spectroscopy in hBN-encapsulated and graphene-contacted MoS(2) field-effect transistors (FETs). The low disorder of this...
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
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