Abstract:Amplitude-modulated (AM) atomic force microscopy (AFM), also known as tapping or AC mode, is a proven, reliable, and gentle imaging method with widespread applications. Previously, the contrast in AM-AFM has been difficult to quantify. AFM loss tangent imaging is a recently introduced technique that recasts AM mode phase imaging into a single term tan δ that includes both the dissipated and stored energy of the tip-sample interaction. It promises fast, versatile mapping of variations in near-surface viscoelastic properties. However, experiments to date have generally obtained values larger than expected for the viscoelastic loss tangent of materials. Here, we explore and discuss several practical considerations for AFM loss tangent imaging experiments. A frequent limitation to tapping in air is Brownian (thermal) motion of the cantilever. This fundamental noise source limits the accuracy of loss tangent estimation to approximately 0.01<tan δ<5 in air. In addition, surface effects including squeeze film damping, adhesion, and plastic deformation can contribute in a manner consistent with experimentally observed overestimations. For squeeze film damping, we demonstrate a calibration technique that removes this effect at every pixel. Finally, temperature-dependent imaging in a two-component polymeric film demonstrates that this technique can identify temperature-dependent phase transitions, even in the presence of such non-ideal interactions. These results help understand the limits and opportunities not only of this particular technique but also of AM mode with phase imaging in general.

Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy

Theory of small amplitude bimodal atomic force microscopy in ambient conditions

Interfacial interaction and enhanced image contrasts in higher mode and bimodal mode atomic force microscopy

Improved Sensitivity for Subsurface Imaging by Contact Resonance Atomic Force Microscopy Using Fano Peaks

Optimizing atomic resolution of force microscopy in ambient conditions

Focal modulation microscopy with annular apertures: a numerical study.

Determining surface properties with bimodal and multimodal AFM

Simulations of Subnanometer Scale Image Contrast in Atomic Force Microscopy of Self-Assembled Monolayers in Water

Quantitative Formulation of Frequency-Dependent Average Force in AM-AFM

Directional Energy Transfer in a Coupled Symmetrical Multifrequency Atomic Force Microscope Cantilever

Enhanced quality factors and force sensitivity by attaching magnetic beads to cantilevers for atomic force microscopy in liquid

Guidelines for Fast and Nondestructive Imaging in AM-AFM

Conditions to minimize soft single biomolecule deformation when imaging with atomic force microscopy

Imaging contrast and tip-sample interaction of non-contact amplitude modulation atomic force microscopy with Q-control

Finite Element Modelling of Atomic Force Microscopy Imaging on Deformable Surfaces

Enhanced Phase and Amplitude Image Contrasts of Polymers in Bimodal Atomic Force Microscopy

Interaction imaging with amplitude-dependence force spectroscopy

High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy

Practical loss tangent imaging with amplitude-modulated atomic force microscopy

Artifactual atomic displacements on surfaces using annular dark-field images with image simulation

The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy