Abstract:The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a mainstay characterization tool for investigating these materials due to its unprecedented ability to locally probe electromechanically responsive materials with spatial resolution from microns to nanometers. However, with the wide popularity of VM-AFM techniques such as piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM) there has been a rise in reports of nanoscale electromechanical functionality, including hysteresis, in materials that should be incapable of exhibiting piezo- or ferroelectricity. Explanations for the origins of unexpected nanoscale phenomena have included new material properties, surface-mediated polarization changes and/or spatially resolved behavior that is not present in bulk measurements. At the same time, it is well known that VM-AFM measurements are susceptible to numerous forms of crosstalk and, despite efforts within the AFM community, a global approach for eliminating this has remained elusive. In this work, we develop a method for easily demonstrating the presence of hysteretic (ie, false ferroelectric) long-range interactions between the sample and cantilever body. This method should be easy to implement in any VM-AFM measurement. We then go on to demonstrate fully quantitative and repeatable nanoelectromechanical characterization using an interferometer. These quantitative measurements are critical for a wide range of devices including mems actuators and sensors, memristor, energy storage and memory.

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Molecular Dynamics Simulation of Form Measurement Process of Soft Materials Using Atomic Force Microscope

Improved Sensitivity for Subsurface Imaging by Contact Resonance Atomic Force Microscopy Using Fano Peaks

Excitation Frequency Dependence of Noise and Minimum Detectable Force in AM-AFM

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Quantitative Electrostatic Force Measurement and Characterization Based on Oscillation Amplitude Using Atomic Force Microscopy

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Directional Energy Transfer in a Coupled Symmetrical Multifrequency Atomic Force Microscope Cantilever

Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

Optimizing the Quality Factor of Quartz Tuning Fork Force Sensor for Atomic Force Microscopy: Impact of Additional Mass and Mass Rebalance

Interaction imaging with amplitude-dependence force spectroscopy

Calibration of the Effective Spring Constant of Ultra-Short Cantilevers for A High-Speed Atomic Force Microscope

J0610104 Evaluation of Interatomic Force on the Tip of Probe by Using Microwave Atomic Force Microscope

Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopy

Measurement of the complete interaction force curve at the nanoscale

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Amplitude modulation atomic force microscopy, is acoustic driving in liquid quantitatively reliable?

Quantitative Electromechanical Atomic Force Microscopy