Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning

Jaewoo Jeong,Taeyeong Kim,Bong Jae Lee,Jungchul Lee
DOI: https://doi.org/10.1002/aisy.202370003
IF: 7.298
2023-01-01
Advanced Intelligent Systems
Abstract:Atomic Force Microscopy In article number 2200317, Bong Jae Lee, Jaewoo Jeong, and co‐workers present a deep learning model that predicts atomic force microscope (AFM) topographies from optical microscope (OM) images. Using the proposed multi‐domain autoencoder model, the upscale resolution of 1.72 fold is achieved from OM to AFM with a ~15% margin of error. Based on such proficiency, its simultaneous applications in surface morphological classification and simulation of dynamic surfaces’ transformation are successfully demonstrated.
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