General Resolution Enhancement Method in Atomic Force Microscopy (AFM) Using Deep Learning

Y. Liu,Q. M. Sun,Dr. W. H. Lu,Dr. H. L. Wang,Y. Sun,Z. T. Wang,X. Lu,Prof. K. Y. Zeng
DOI: https://doi.org/10.48550/arXiv.1809.03704
2018-09-11
Abstract:This paper develops a resolution enhancement method for post-processing the images from Atomic Force Microscopy (AFM). This method is based on deep learning neural networks in the AFM topography measurements. In this study, a very deep convolution neural network is developed to derive the high-resolution topography image from the low-resolution topography image. The AFM measured images from various materials are tested in this study. The derived high-resolution AFM images are comparable with the experimental measured high-resolution images measured at the same locations. The results suggest that this method can be developed as a general post-processing method for AFM image analysis.
Data Analysis, Statistics and Probability,Materials Science
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