Image Enhancement For Fluorescence Microscopy Based On Deep Learning With Prior Knowledge Of Aberration

Lejia Hu,Shuwen Hu,Wei Gong,Ke Si
DOI: https://doi.org/10.1364/OL.418997
IF: 3.6
2021-01-01
Optics Letters
Abstract:In this Letter, we propose a deep learning method with prior knowledge of potential aberration to enhance the fluorescence microscopy without additional hardware. The proposed method could effectively reduce noise and improve the peak signal-to-noise ratio of the acquired images at high speed. The enhancement performance and generalization of this method is demonstrated on three commercial fluorescence microscopes. This work provides a computational alternative to overcome the degradation induced by the biological specimen, and it has the potential to be further applied in biological applications. (C) 2021 Optical Society of America
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