A modified chain group sampling inspection plan for the time truncated life test and it’s applications

Harsh Tripathi,Mahendra Saha,Sanku Dey
DOI: https://doi.org/10.1007/s41872-023-00215-9
2023-01-17
Life Cycle Reliability and Safety Engineering
Abstract:In this paper a modified group acceptance sampling plan using chaining the past lot(s) results is developed called modified chain group acceptance sampling inspection plan (MChGSP). This sampling plan is based on time truncated lifetimes when the lifetime of an item follows the generalized exponential distribution with known shape parameter. The proposed modified sampling plan requires a smaller sample size than the commonly used sampling inspection plans, such as group acceptance sampling inspection plan and in particular single acceptance sampling inspection plan. Minimum number of group sizes and operating characteristic values are obtained for fixed group size by using two point approach such as acceptable quality level and limiting quality level and are presented in tabular form for the proposed plan. The performance of the proposed MChGSP is then evaluated by comparing it with GSP and SSP. Three real life examples have been considered to illustrate the applicability of the proposed MChGSP.
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