An image-based quantitative model of surface measurement complexity for on-machine measurement

Gaocai Fu,Buyun Sheng,Yingkang Lu,Ruiping Luo,Ganlin Sheng,Yuzhe Huang
DOI: https://doi.org/10.1007/s00170-022-10585-6
IF: 3.563
2022-11-30
The International Journal of Advanced Manufacturing Technology
Abstract:With the on-machine measurement (OMM) technology, the quality of curved workpieces can be measured directly on the machine after computer numerical control machining. Aiming at the problem that the complexity of surface measurement in traditional methods is only judged by subjective experience and is difficult to calculate, an image-based surface measurement complexity (SMC) quantitative model is proposed. First, according to the curved surfaces’ characteristics during the OMM process, the concept of SMC is introduced by analyzing several key factors. Then, the curvature and smoothness information of three-dimensional surfaces is converted into two-dimensional images’ information by using the conformal mapping with dimensionality reduction. Next, based on the image color and texture complexity calculation, a mathematical model combined with the area and profile correction coefficients is established. Finally, the SMC model’s validity is verified by a set of design-machining-inspection experiments on curved surfaces, and the relevant laws between the SMC and measurement efficiency and measurement accuracy are presented.
engineering, manufacturing,automation & control systems
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