Topological analysis of X-ray CT data for the recognition and trending of subtle changes in microstructure under material aging
A. Maiti,A. Venkat,G.D. Kosiba,W.L. Shaw,J.D. Sain,R.K. Lindsey,C.D. Grant,P.-T. Bremer,A.G. Gyulassy,V. Pascucci,R.H. Gee
DOI: https://doi.org/10.1016/j.commatsci.2020.109782
IF: 3.572
2020-09-01
Computational Materials Science
Abstract:X-ray computed tomography (CT) is an established non-destructive tool for 3D imaging of multiphasic composites. Numerous applications of X-ray CT in medical diagnosis and materials characterization have been reported, many involving field-specific innovations in the imaging technology itself. Yet, quantitative summarization to link image features to properties of interest has been rare. We address this issue by employing state-of-the-art technics in scalar field topology for the summarization of X-ray CT images of an example biphasic system. By varying processing-parameters we create different microstructures, evolve them through accelerated thermal aging, CT-image them pre- and post-aged, and demonstrate the ability of our image summarization method to systematically track process- and age-related changes, which can often be very subtle. A novel aspect of the algorithm involves recognition over multiple resolution levels, which provides deeper insight into the pattern relationship between grain-like features and their neighbors. The method is general, adaptable to diverse image reconstruction methods and materials systems, and particularly useful in applications where practical constraints on the sample-size limits the reliable use of more complex models, e.g., convolutional neural networks.
materials science, multidisciplinary