On Open and Strong-Scaling Tools for Atom Probe Crystallography: High-Throughput Methods for Indexing Crystal Structure and Orientation

Markus Kühbach,Matthew Kasemer,Baptiste Gault,Andrew Breen

DOI: https://doi.org/10.48550/arXiv.2009.00735

2020-09-02

Abstract:Volumetric crystal structure indexing and orientation mapping are key data processing steps for virtually any quantitative study of spatial correlations between the local chemistry and the microstructure of a material. For electron and X-ray diffraction methods it is possible to develop indexing tools which compare measured and analytically computed patterns to decode the structure and relative orientation within local regions of interest. Consequently, a number of numerically efficient and automated software tools exist to solve the above characterisation tasks. For atom probe tomography (APT) experiments, however, the strategy of making comparisons between measured and analytically computed patterns is less robust because many APT datasets may contain substantial noise. Given that general enough predictive models for such noise remain elusive, crystallography tools for APT face several limitations: Their robustness to noise, and therefore, their capability to identify and distinguish different crystal structures and orientation is limited. In addition, the tools are sequential and demand substantial manual interaction. In combination, this makes robust uncertainty quantifying with automated high-throughput studies of the latent crystallographic information a difficult task with APT data. To improve the situation, we review the existent methods and discuss how they link to those in the diffraction communities. With this we modify some of the APT methods to yield more robust descriptors of the atomic arrangement. We report how this enables the development of an open-source software tool for strong-scaling and automated identifying of crystal structure and mapping crystal orientation in nanocrystalline APT datasets with multiple phases.

Computational Physics,Materials Science,Artificial Intelligence,Computer Vision and Pattern Recognition

What problem does this paper attempt to address?

The problem that this paper attempts to solve is the challenge of crystal structure indexing and crystal orientation mapping in atom probe tomography (APT) data. Specifically:

1. **Noise problem**: Many APT data sets may contain a large amount of noise, which makes it less reliable to identify different crystal structures and orientations by comparing measured and analytical calculation patterns. Due to the current lack of a generally applicable prediction model to describe this noise, the existing crystallographic tools have limitations in noise resistance.

2. **Automation and high - throughput processing**: Existing tools are usually processed sequentially and require a large amount of human interaction, which makes it difficult to automatically identify the crystal structures and crystal orientations of multiple phases in nanocrystalline APT data sets.

3. **Accuracy and reliability**: Current methods have difficulty observing crystallographic information when dealing with complex material systems, especially when different phases cause changes in local evaporation field conditions. In addition, increasing the base temperature or using the laser pulse mode can increase the sample yield, but it will reduce the quality of the recoverable crystallographic information.

To improve these problems, the author reviewed the existing methods and discussed their connections with the methods in the diffraction community. On this basis, the author modified some APT methods to generate more robust atomic arrangement descriptors and developed an open - source software tool for highly scalable and automated crystal structure identification and crystal orientation mapping. These improvements aim to improve the robustness to noise, reduce the need for manual operation, and achieve efficient parallel processing, so that high - throughput crystallographic research can be carried out in APT data sets.