Towards scanning nanostructure X‐ray microscopy
Anton Kovyakh,Soham Banerjee,Chia-Hao Liu,Christopher J Wright,Yuguang C Li,Thomas E Mallouk,Robert Feidenhans'l,Simon J L Billinge,Christopher J. Wright,Yuguang C. Li,Thomas E. Mallouk,Simon J. L. Billinge
DOI: https://doi.org/10.1107/s1600576723005927
IF: 4.868
2023-07-30
Journal of Applied Crystallography
Abstract:A semi‐automated workflow is described for rapid‐scanning powder X‐ray diffraction and pair distribution function experiments. The software infrastructure saves metadata and raw and analyzed files into a collection stored on the local hard drive for easier reuse.This article demonstrates spatial mapping of the local and nanoscale structure of thin film objects using spatially resolved pair distribution function (PDF) analysis of synchrotron X‐ray diffraction data. This is exemplified in a lab‐on‐chip combinatorial array of sample spots containing catalytically interesting nanoparticles deposited from liquid precursors using an ink‐jet liquid‐handling system. A software implementation is presented of the whole protocol, including an approach for automated data acquisition and analysis using the atomic PDF method. The protocol software can handle semi‐automated data reduction, normalization and modeling, with user‐defined recipes generating a comprehensive collection of metadata and analysis results. By slicing the collection using included functions, it is possible to build images of different contrast features chosen by the user, giving insights into different aspects of the local structure.
chemistry, multidisciplinary,crystallography