Local Crystallography for Quantitative Analysis of Atomically Resolved Images

Alex Belianinov,Qian He,Mikhail Kravchenko,Stephen Jesse,Albina Borisevich,Sergei V. Kalinin
DOI: https://doi.org/10.1017/s1431927616005584
IF: 4.0991
2016-01-01
Microscopy and Microanalysis
Abstract:High-resolution imaging in scanning transmission electron microscopies and its probe-based brethren, allows 10 pm or better precision measurements of atomic positions. This level of fidelity is sufficient to correlate the length and energy of a chemical bond to a functional material property. By finding all the atoms in an image and analyzing their local atomic neighborhoods we can quantify and identify phases, structural defects and other properties of multiphase samples.[1] This automatic analysis lays the groundwork for processing dynamic data and amassing structure-property libraries based on the analysis of local atomic behavior.
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