Performance Enhancement of Cadmium‐Free Quantum‐Dot Light‐Emitting Diodes via Cl‐Passivated Zn1−x−ySnxMgyO Nanoparticles as Electron Transport Layers

Jinxing Zhao,Lijin Wang,Peiwen Lv,Fenghe Wang,Xu Li,Song Chen,Lei Qian,Aiwei Tang
DOI: https://doi.org/10.1002/lpor.202200749
2023-02-13
Abstract:Interfacial engineering plays an important role in the performance improvement of quantum‐dot light‐emitting diodes (QLEDs). This work provides Cl‐passivated and Sn, Mg co‐doped ZnO nanoparticles as electron transport layer for enhancing the device performance of cadmium‐free QLEDs. The device exhibits an improved external quantum efficiency with a reduced efficiency roll‐off. Although cadmium (Cd)‐based nanocrystals have enabled high‐performance quantum‐dot light‐emitting diodes (QLEDs), their mass production is likely to be affected by environmental protection policies. Among all the potential Cd‐free candidates, Cu‐In‐Zn‐S (CIZS) nanocrystals (NCs) have attracted particular interests. Still, the performance of the corresponding LED is currently limited by imbalanced charge injection and luminescence quenching, which are both related to the ZnO‐based electron transporting layer (ETL). This work demonstrates that ZnO nanoparticles (NPs) doped with Sn, Mg (Zn1−x−ySnxMgyO), and passivated with Cl are promising to resolve the above issues. All‐solution‐processed QLEDs based on Cd‐free CIZS NCs are fabricated by using Zn0.9Sn0.1O NPs as the ETL, and the peak external quantum efficiency (EQEmax) was nearly twice that of ZnO (EQEmax = 1.74%). The main reason is that the incorporation of Sn can reduce the conductivity of ZnO by an order of magnitude. Combining the advantages of Zn0.9Sn0.1O, Zn0.8Sn0.1Mg0.1O@Cl NPs are designed by the co‐doping of Mg and Cl passivation. The EQEmax and current efficiency based on Zn0.8Sn0.1Mg0.1O and Zn0.8Sn0.1Mg0.1O@Cl as ETLs are further increased to 4.84%, 14.00 cd A−1 and 5.53%, 15.99 cd A−1, respectively. The positive effects of Mg ions can remarkably optimize energy level structure to balance charge injection, while Cl can further passivate defects. The findings offer a new guideline for developing Cd‐free light‐emitting diodes.
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