Abstract:Solar cells may possess defects during the manufacturing process in photovoltaic (PV) industries. To precisely evaluate the effectiveness of solar PV modules, manufacturing defects are required to be identified. Conventional defect inspection in industries mainly depends on manual defect inspection by highly skilled inspectors, which may still give inconsistent, subjective identification results. In order to automatize the visual defect inspection process, an automatic cell segmentation technique and a convolutional neural network (CNN)-based defect detection system with pseudo-colorization of defects is designed in this paper. High-resolution Electroluminescence (EL) images of single-crystalline silicon (sc-Si) solar PV modules are used in our study for the detection of defects and their quality inspection. Firstly, an automatic cell segmentation methodology is developed to extract cells from an EL image. Secondly, defect detection can be actualized by CNN-based defect detector and can be visualized with pseudo-colors. We used contour tracing to accurately localize the panel region and a probabilistic Hough transform to identify gridlines and busbars on the extracted panel region for cell segmentation. A cell-based defect identification system was developed using state-of-the-art deep learning in CNNs. The detected defects are imposed with pseudo-colors for enhancing defect visualization using K-means clustering. Our automatic cell segmentation methodology can segment cells from an EL image in about 2.71 s. The average segmentation errors along the x-direction and y-direction are only 1.6 pixels and 1.4 pixels, respectively. The defect detection approach on segmented cells achieves 99.8% accuracy. Along with defect detection, the defect regions on a cell are furnished with pseudo-colors to enhance the visualization.

Automatic Defect Inspection for Monocrystalline Solar Cell Interior by Electroluminescence Image Self-Comparison Method

Efficient Cell Segmentation from Electroluminescent Images of Single-Crystalline Silicon Photovoltaic Modules and Cell-Based Defect Identification Using Deep Learning with Pseudo-Colorization

A CISG Method for Internal Defect Detection of Solar Cells in Different Production Processes

CNN-based Model for Cell Extraction from PV Modules with EL Images for PV Defects Detection

Automated visual inspection of solar cell images using adapted morphological and edge detection algorithms

Automatic Classification of Defective Photovoltaic Module Cells in Electroluminescence Images

Defect Detection with Generative Adversarial Networks for Electroluminescence Images of Solar Cells

A Deep Two-Stage Scheme for Polycrystalline Micro-Crack Detection

Deep Learning Based Model for Defect Detection of Mono-Crystalline-Si Solar PV Module Cells in Electroluminescence Images Using Data Augmentation

Spherical Optical Surface Defects Digitizing Evaluation System

CNN based automatic detection of photovoltaic cell defects in electroluminescence images

Surface defect detection of solar cells based on Fourier single-pixel imaging for removal of substrates interference

Convolution Neural Network Based Polycrystalline Silicon Photovoltaic Cell Linear Defect Diagnosis Using Electroluminescence Images

Solar Cell Surface Defect Inspection Based on Multispectral Convolutional Neural Network

Segmentation of Photovoltaic Module Cells in Uncalibrated Electroluminescence Images

Solar Cells Surface Defects Detection Based on Deep Learning

Automatic Processing and Solar Cell Detection in Photovoltaic Electroluminescence Images

Deep-Learning-Based Automatic Detection of Photovoltaic Cell Defects in Electroluminescence Images

Polycrystalline Silicon Wafer Surface Color Defect Inspection Based on Machine Vision

Deep Learning-Based Algorithm for Multi-Type Defects Detection in Solar Cells with Aerial EL Images for Photovoltaic Plants

Deep learning-based method for defect detection in electroluminescent images of polycrystalline silicon solar cells