Convolution Neural Network Based Polycrystalline Silicon Photovoltaic Cell Linear Defect Diagnosis Using Electroluminescence Images

Wuqin Tang,Qiang Yang,Xiaochen Hu,Wenjun Yan
DOI: https://doi.org/10.1016/j.eswa.2022.117087
IF: 8.5
2022-01-01
Expert Systems with Applications
Abstract:Electroluminescence (EL) is considered an efficient technique for the quality assessment of photovoltaic (PV) modules through observing the cell internal characteristics. Most cell defects exhibit the linear characteristics in the EL images that can gradually develop into fatal defects. However, such linear features can be hardly identified in the EL images of the polycrystalline silicon cells due to complex backgrounds. Numerous algorithmic solutions have been developed for module defect detection and analysis, but few results are reported for defects diagnosis of EL images. This paper proposes a deep learning-based automatic linear defects diagnosis solution for polycrystalline silicon photovoltaic cells based on EL images. The Hessian matrix-based defects feature extraction and a multi-scale line detector-based defect feature enhancement are adopted to achieve improved performance. A deep learning-based model for defects diagnosis is also proposed. The proposed solution is extensively evaluated through experiments against the existing machine learning models, i.e. Vgg16, ResNet50 and InceptionV3. The numerical results demonstrate the effectiveness and superiority of the proposed solution.
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