Abstract:Upon the development of the quantitative scanning transmission electron microscopy (QSTEM), individually counting the gold atom has been achieved. The correlation of the signals to the atom quantity (N), i.e. calibration, is its crucial work. One has to seek the ultra-fine mass standards, where the size-selected gold clusters rank the best recently. However, practically this is difficult for light elements, since STEM intensity is proportional to Zα, where Z is atomic number of the elements and α is in the range of 1.5-1.9 depending on the detector collection angle, sample thickness, and the Debye-Waller factor of the atomic species. As a result, the light elements would have a much weaker image contrast than that of heavy elements. This could be even more difficult for the carbon particles supported by the Formvar films. Graphene layers are featured by large scale uniformity and discrete layer steps, which shed light on precision calibration of the carbon atomic scales. To establish direct correlation between the STEM intensity with the number of layers in graphene sheets, we apply an independent layer counting method by utilizing dark lines in bright field TEM images at the edge of graphene sheets [2]. We search over a large area of the sample for the freely suspending graphene sheets (for example, the area indicated by the arrows in Fig. 1a)[3]. Fig. 1b displays a typical example of such an edge, where the layer number can be counted in the high-resolution bright field image and the STEM intensity is also obtained. The calibration in the few-layer range gives Fig. 1c, where a linear relationship is apparent. The calibration performed over an extended thickness presents a precise exponential growth. The behaviour can be described by the incoherent scattering picture of single scattering. This leads to accurate measurement of the electron mean free path (The error is reduced to 5 percent). The calibration relation works from individual u- to millions of carbon atoms.

Quantitative annular dark-field imaging of single-layer graphene—II: atomic-resolution image contrast

Effects of Non-Rotationally Symmetric Aberrations on the Quantitative Measurement of Lattice Positions in a Graphene Monolayer Using High-Resolution Transmission Electron Microscopy

Artifactual atomic displacements on surfaces using annular dark-field images with image simulation

Dark-field transmission electron microscopy and the Debye-Waller factor of graphene

A Novel Atomic Force Microscope with High Stability and Scan Speed

High contrast imaging and thickness determination of graphene with in-column secondary electron microscopy

Scaling the Dynamic Electron Scattering in Imaging the Graphene Sheets by the High-Angle Annular Dark-Field Microscopy.

Nanoscale Probing of Interaction in Atomically Thin Layered Materials

Optical image-based thickness characterization of atomically thin nanomaterials using computer vision techniques

Non-destructive and Rapid Evaluation of CVD Graphene by Dark Field Optical Microscopy

Projection angle dependence in grating-based X-ray dark-field imaging of ordered structures

High resolution IR spectroscopy and imaging based on graphene micro emitters

Digital Dark Field -- Higher Contrast and Greater Specificity Dark Field Imaging using a 4DSTEM Approach

Simulations of Subnanometer Scale Image Contrast in Atomic Force Microscopy of Self-Assembled Monolayers in Water

Atomically Resolved Imaging of Highly Ordered Alternating Fluorinated Graphene

Z-contrast Atom Counting Using the Few-Layer Graphene Sheets

Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection

Atomic resolution imaging of the two-component Dirac-Landau levels in a gapped graphene monolayer

Electron ptychography of 2D materials to deep sub-ångström resolution

Free-standing Graphene at Atomic Resolution

Optical Imaging and Spectroscopy of Atomically Precise Armchair Graphene Nanoribbons.