Graphene on silicon dioxide via carbon ion implantation in copper with PMMA-free transfer

Jan Lehnert,Daniel Spemann,M. Hamza Hatahet,Stephan Mändl,Michael Mensing,Annemarie Finzel,Aron Varga,Bernd Rauschenbach
DOI: https://doi.org/10.1063/1.4985437
IF: 4
2017-06-05
Applied Physics Letters
Abstract:In this work, a synthesis method for the growth of low-defect large-area graphene using carbon ion beam implantation into metallic Cu foils is presented. The Cu foils (1 cm2 in size) were pre-annealed in a vacuum at 950 °C for 2 h, implanted with 35 keV carbon ions at room temperature, and subsequently annealed at 850 °C for 2 h to form graphene layers with the layer number controlled by the implantation fluence. The graphene was then transferred to SiO2/Si substrates by a PMMA-free wet chemical etching process. The obtained regions of monolayer graphene are of ∼900 μm size. Raman spectroscopy, atomic force microscopy, scanning electron microscopy, and optical microscopy performed at room temperature demonstrated a good quality and homogeneity of the graphene layers, especially for monolayer graphene.
physics, applied
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