Passivation Behavior of a Zr60Cu20Ni8Al7Hf3Ti2 Bulk Metallic Glass in Sulfuric Acid Solutions

Junlei Tang,Yingying Wang,Qiuhong Zhu,Mohamad Chamas,Hu Wang,Jichao Qiao,Yuanqiang Zhu,Bernard Normand,
DOI: https://doi.org/10.20964/2018.07.17
IF: 1.541
2018-07-01
International Journal of Electrochemical Science
Abstract:The passivation behavior of Zr60Cu20Ni8Al7Hf3Ti2 bulk metallic glass (BMG) in H2SO4 solutions were studied by electrochemical measurements and X-ray photoelectron spectroscopy. The influence of H2SO4 solutions concentration and temperature, heat treatment temperature and erosion on passivation behavior were analyzed. The corrosion resistance of Zr60Cu20Ni8Al7Hf3Ti2 bulk metallic glass decreases slightly with the increase of concentration and temperature of H2SO4 solutions. The Zr-based BMG exhibits excellent passivation ability in various H2SO4 solutions. The formed passive films in H2SO4 solutions possess the semiconductor characteristics depending of applied potential, and show n-type semiconductor in stable passivation region. The main component of passive films is ZrO2 in competition with HfO2 and Al2O3, and no Ni element, and the alloy surface whose passive film contains less Cu and more Al2O3 and less Cu, hence the alloy exhibits can have better corrosion resistance. Annealing which temperatures are lower than Tg were conducted. After the heat treatment, Zr-based BMG maintains amorphous structure, and the electrochemical behavior of Zr-based BMG does not show obvious difference. However, the heat treatment improves BMG’ micro-hardness. Consequently, the Zr-based BMG after heat treatment has stronger erosion-corrosion resistance than the as-cast BGM.
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