A method for the characterization of intra-pixel response of infrared sensor

Zhuoyue Hu,Xiaofeng Su,Xiaoyan Li,Lili Zhang,Fansheng Chen
DOI: https://doi.org/10.1007/s11082-019-1790-3
IF: 3
2019-02-28
Optical and Quantum Electronics
Abstract:Due to the response variations within a pixel, response of sensor varies with the positions of the point target. The accurate measurement of intra-pixel response of the sensor is the key to high-precision centroid estimation and radiometric calibration. In this paper, we establish an intra-pixel response model based on the pixel structure and use Gauss function to describe the beam spot profile. We further calculate the full width at half maximum (FWHM) of the Gauss function and the fill factor of the infrared sensor using the grid search algorithm. Experimental results show that the Gauss function FWHM differences among different pixels using the same radius could be less than 6%. The fill factors are not constant in different pixels because of errors in the process of manufacture and assembly, and the error between model and measured values is less than 3.6%. This work could be useful for stellar calibration and centroid estimation.
engineering, electrical & electronic,optics,quantum science & technology
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