Gallium Oxide for High‐Power Optical Applications

Huiyang Deng,Kenneth J. Leedle,Yu Miao,Dylan S. Black,Karel E. Urbanek,Joshua McNeur,Martin Kozák,Andrew Ceballos,Peter Hommelhoff,Olav Solgaard,Robert L. Byer,James S. Harris
DOI: https://doi.org/10.1002/adom.201901522
IF: 9
2020-01-20
Advanced Optical Materials
Abstract:<p>Gallium oxide (Ga<sub>2</sub>O<sub>3</sub>) is an emerging wide‐bandgap transparent conductive oxide (TCO) with potential applications for high‐power optical systems. Herein, Ga<sub>2</sub>O<sub>3</sub> fabricated nanostructures are described, which demonstrate high‐power laser induced damage threshold (LIDT). Furthermore, the demonstration of an electron accelerator based on Ga<sub>2</sub>O<sub>3</sub> gratings is reported. These unique Ga<sub>2</sub>O<sub>3</sub> nanostructures provide acceleration gradients exceeding those possible with conventional RF accelerators due to the high breakdown threshold of Ga<sub>2</sub>O<sub>3</sub>. In addition, the laser damage threshold and acceleration performance of a Ga<sub>2</sub>O<sub>3</sub>‐based dielectric laser accelerator (DLA) are compared with those of a DLA based on sapphire, a material known for its high breakdown strength. Finally, the potential of Ga<sub>2</sub>O<sub>3</sub> thin‐film coatings as field reduction layers for Si nanostructures is shown; they potentially improve the effective LIDT and performance of Si‐based DLAs and other high‐power optical structures. These results could provide a foundation for new high‐power optical applications with Ga<sub>2</sub>O<sub>3</sub>.</p>
materials science, multidisciplinary,optics
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