Abstract:An experimental study of the phenomenon of electric current influence on the value and orientation of the exchange bias field (HEB) in the Pt/Co/NiO structure is carried out. Depending on the direction of the magnetization in a ferromagnet (FM) layer and the current pulse amplitude, the value of the HEB field can be changed repeatedly in the range of ±7.5 mT. A few experiments are performed to separate the contributions from two current-induced effects: (i) an injection of the spin current into an antiferromagnet layer (AFM) and (ii) Joule heating. As a result, we conclude that the modification in the HEB field during current pulse transmission in the Pt/Co/NiO structure is due to heating and the low value of Néel temperature (TN = 162 °C). This fact explains the absence of the exchange bias effect on the spin–orbit torque (SOT)-assisted magnetization switching. The most striking observation to emerge from the experimental data analysis is that depending on the initial spin configuration of the domain structure in the FM layer and the current pulse amplitude, the exchange bias can be changed locally. This opens up prospects for creating exchange-coupled FM/AFM structures with dynamically tuned parameters of the exchange bias, which can be used for the development of magnetic memory, neuromorphic, and logic devices based on magnetic nanosystems.The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acsami.1c12683.Estimation of the current stabilization time in the Hall bar; method for evaluating the SOT field; estimation of the current heating effect; Néel temperature estimation; measuring method when passing the current; measurement method during the external heating; measurement method during the cooling; comparison of magnetization estimation by AHE and Kerr microscopy; temperature dependence of the coercive force and the exchange bias field; estimation of the magnetic parameters of the Pt/Co/NiO films by the induction method (PDF)This article has not yet been cited by other publications.

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