Abstract:Journal Article From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging Get access Hua Guo, Hua Guo Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Liang Jin, Liang Jin Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Penghan Lu, Penghan Lu Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China Search for other works by this author on: Oxford Academic Google Scholar Zhangjie Wang, Zhangjie Wang Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China Search for other works by this author on: Oxford Academic Google Scholar Zhiwei Shan, Zhiwei Shan Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China Search for other works by this author on: Oxford Academic Google Scholar Benjamin Bammes, Benjamin Bammes Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Michael Spilman, Michael Spilman Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Robert Bilhorn Robert Bilhorn Direct Electron, LP, San Diego, CA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 343–344, https://doi.org/10.1017/S1431927615002512 Published: 23 September 2015

Evaluation and application of a new scintillator‐based heat‐resistant back‐scattered electron detector during heat treatment in the scanning electron microscope

Development and application of a high-temperature imaging system for in-situ scanning electron microscope

Development of a microfurnace dedicated to in situ scanning electron microscope observation up to 1300 °C. II. Study of the thermal response of samples

A novel instrument for investigating the dynamic microstructure evolution of high temperature service materials up to 1150 C in scanning electron microscope

Measurement of electron beam induced sample heating in SEM experiments

A novel nano-scale non-contact temperature measurement technique for crystalline materials

In Situ Scanning Electron Microscopy-Based High-Temperature Deformation Measurement of Nickel-Based Single Crystal Superalloy Up to 800°C

In situ high-temperature emissivity measurements of heat-treated, silicon coated stainless steel for solar thermal applications

From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging

Spectral Pyrometry for Practical Temperature Measurement in the TEM

In-situ High-Temperature Mechanical Property Measurement Technology and Its Application in Scanning Electron Microscope

High temperature measurement set-up for the electro-mechanical characterization of robust thin film systems

Growth and Faceting of Tungsten and Oxides in Scandate Cathode Particles during In Situ Heating in the Scanning Electron Microscope

MEMS-based in situ electron-microscopy investigation of rapid solidification and heat treatment on eutectic Al-Cu

In Situ Scanning–digital Image Correlation for High-Temperature Deformation Measurement of Nickel-Based Single Crystal Superalloy

Construction and Characterization of a Heating Stage for a Scanning Probe Microscope Up to 215 °C

Quantifying Real-Time Sample Temperature Under the Gas Environment in the Transmission Electron Microscope Using a Novel MEMS Heater

Overview of S(T)EM electron detectors with garnet scintillators: Some potentials and limits

High-efficiency detector of secondary and backscattered electrons for low-dose imaging in the ESEM

Adaptation of a Differential Scanning Calorimeter for Simultaneous Electromagnetic Measurements

In Situ High Temperature Microwave Microscope for Nondestructive Detection of Surface and Sub-Surface Defects.