Abstract:Developing an accelerated acceptance sampling plan (AASP) is essential to product reliability demonstration, particularly for a product designed to have high reliability and long lifetime. Because of acceleration, a decision on lot acceptance for the product can be quickly made while significantly reducing the total cost of testing. Traditionally, the parameters of an acceptance probability function used in AASP are assumed to be known in advance. However, it is often difficult, if not impossible, to determine the exact values of these parameters. On the other hand, prior information, including earlier test results and expert opinions, may be available for potential uses in planning such tests. In this paper, Bayesian designs of AASP are considered by taking full advantage of prior information to reduce the uncertainty in these important parameters so that significant testing resources (e.g., sample size and testing time) can be saved. In particular, a product with a lognormal lifetime distribution is studied, and two types of Bayesian AASPs under Type-I censoring are developed based on the product's operating characteristic (OC) curve. The first Bayesian AASP considers the risks of the producer and the consumer simultaneously, while the second one considers only the consumer's risk. The optimal sampling plans aim at minimizing the total costs of testing. The proposed AASPs are illustrated using two numerical examples. Sensitivity analysis on the selection of prior distribution is also performed to validate the robustness of the proposed Bayesian AASPs. In addition, a comparison study shows that the proposed test plans outperform the traditional AASPs with respect to the use of testing resources.

AN ECONOMIC ACCELERATED LIFE TEST ACCEPTANCE SAMPLING PLAN

Acceptance sampling plan of accelerated life testing for lognormal distribution under time-censoring

Acceptance sampling plans based on failure‐censored step‐stress accelerated tests for Weibull distributions

Optimal reliability acceptance sampling plan based on accelerated life test data

Design of Reliability Acceptance Sampling Plans Under Partially Accelerated Life Test

Acceptance sampling based on life tests: Log-logistic model

Optimal Constant-Stress Accelerated Life Test Plans for One-Shot Devices with Components Having Exponential Lifetimes under Gamma Frailty Models

Bayesian accelerated acceptance sampling plans for a lognormal lifetime distribution under Type-I censoring

Interval estimation of the two-parameter exponential constant stress accelerated life test model under Type-II censoring

Accelerated Life Test Planning for Minimizing Misclassification Risks

Accelerated acceptance sampling plan with asymmetrical information

Optimal design of reliability acceptance sampling plan based on constant‐stress accelerated life testing considering the uncertainty of accelerated factor

A variables-type multiple-dependent-state sampling plan based on the lifetime performance index under a Weibull distribution

Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Acceptance sampling plan for truncated life test having generalized Pareto distribution

Advances in Accelerated Life Tests With Step and Varying Stress

Design and Evaluation of Accelerated Life Testing Plans with Dual Objectives

Optimal Design of Reliability Acceptance Sampling Plan Based on Data Obtained from Partially Accelerated Life Test (PALT)

Statistical Analysis of Inverse Weibull Constant-Stress Partially Accelerated Life Tests with Adaptive Progressively Type I Censored Data

Design of statistically and energy-efficient accelerated life testing experiments