Grains and grain boundaries in single-layer graphene atomic patchwork quilts

Pinshane Y. Huang,Carlos S. Ruiz-Vargas,Arend M. van der Zande,William S. Whitney,Mark P. Levendorf,Joshua W. Kevek,Shivank Garg,Jonathan S. Alden,Caleb J. Hustedt,Ye Zhu,Jiwoong Park,Paul L. McEuen,David A. Muller
DOI: https://doi.org/10.1038/nature09718
IF: 64.8
2011-01-01
Nature
Abstract:Graphene patchwork analysedSingle-atom-thick graphene sheets can now be produced at metre scales, bringing large-area applications in electronics and photovoltaics closer. But such large pieces can be expected to be polycrystalline, so it is important to determine the nature and size of the grains involved. Huang et al. use transmission electron microscopy to produce atomic-resolution images at grain boundaries, and map the location, orientation and shape of several hundred grains and boundaries using diffraction-filtered imaging. By correlating grain imaging with scanned probe and transport measurements, they show that the grain boundaries dramatically weaken the mechanical strength of graphene membranes, but do not as dramatically alter their electrical properties.
multidisciplinary sciences
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