Abstract:Advanced materials and processing techniques are based largely on the generation and control of non-homogeneous microstructures, such as precipitates and grain boundaries. X-ray tomography can provide three-dimensional density and chemical distributions of such structures with submicrometre resolution1; structural methods exist that give submicrometre resolution in two dimensions2,3,4,5,6,7,8; and techniques are available for obtaining grain-centroid positions and grain-average strains in three dimensions7,9. But non-destructive point-to-point three-dimensional structural probes have not hitherto been available for investigations at the critical mesoscopic length scales (tenths to hundreds of micrometres). As a result, investigations of three-dimensional mesoscale phenomena—such as grain growth10,11, deformation12,13,14,15,16, crumpling17,18,19 and strain-gradient effects20—rely increasingly on computation and modelling without direct experimental input. Here we describe a three-dimensional X-ray microscopy technique that uses polychromatic synchrotron X-ray microbeams to probe local crystal structure, orientation and strain tensors with submicrometre spatial resolution. We demonstrate the utility of this approach with micrometre-resolution three-dimensional measurements of grain orientations and sizes in polycrystalline aluminium, and with micrometre depth-resolved measurements of elastic strain tensors in cylindrically bent silicon. This technique is applicable to single-crystal, polycrystalline, composite and functionally graded materials.

In situ hard X-ray transmission microscopy for material science

High-Resolution Scanning X-ray Diffraction Microscopy

Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics

X-Ray Phase Contrast and Fluorescence Nanotomography for Material Studies

X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions

Three-dimensional X-ray structural microscopy with submicrometre resolution

Time-resolved x-ray microscopy for materials science

Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection

Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science

Demonstrating Soft X-Ray Tomography in the lab for correlative cryogenic biological imaging using X-rays and light microscopy

Three Dimensional Imaging of Biological Samples and Nano-materials Using Soft X-ray Microscopy

Application of laboratory micro X-ray fluorescence devices for X-ray topography

High-speed X-ray Diffraction for Studying Irreversible Materials Structure Dynamics

Diffractive small angle X-ray scattering imaging for anisotropic structures

Micro-XANES: Chemical Contrast in the Scanning Transmission X-ray Microscope

Instrumentation for real-time x-ray topography

A laboratory-based X-ray phase contrast microscopy system for targeting in unstained soft-tissue samples

Time-Resolved X-Ray Scattering of an Electronically Excited State in Metal Complexes in Solution

Spectromicroscopy of Nanoscale Materials in the Tender X-Ray Regime Enabled by a High Efficient Multilayer-Based Grating Monochromator

Nanoscale X-ray Microscopic Imaging of Mammalian Mineralized Tissue.

Full-field Hard X-ray Nano-Tomography at SSRF.