Instrumentation for real-time x-ray topography

H.-J. Queisser,S.-L. Chang,W. Hartmann,G. Markewitz
DOI: https://doi.org/10.1016/0167-5087(83)91205-X
1983-01-01
Abstract:Real-time topography has become important and accessible for investigating the dynamic behavior of materials, their phase transformations, and their defects in materials, because highly brilliant sources, such as rotating-anode X-ray generators and synchrotrons, have now become available. This paper describes instrumentation for real-time topography which we have developed. Our system includes a sample stage, magnifying optics, and an image-processing unit. The sample stage permits applying tensile force and high temperature (up to 1200°C) ambients on the sample. The optical system, containing a special luminescent screen, provides magnification. The image-processing unit can be used for digital image-integration and image-subtraction. The real-time topographic study of motion of dislocation in silicon will be shown as an example. The spatial resolution is better than 10 μm. Although our experiments have been carried out with a rotating-anode X-ray generator, our sample stage and detection system can also be used with a synchrotron source.
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