Single-cell level investigation of microbiologically induced degradation of passive film of stainless steel via FIB-SEM/TEM and multi-mode AFM

Tianyu Cui,Hongchang Qian,Yuntian Lou,Xudong Chen,Tong Sun,Dawei Zhang,Xiaogang Li,Tianyu Cui,Hongchang Qian,Yuntian Lou,Xudong Chen,Tong Sun,Dawei Zhang,Xiaogang Li
DOI: https://doi.org/10.1016/j.corsci.2022.110543
IF: 7.72
2022-09-01
Corrosion Science
Abstract:The degradation of passive films of a stainless steel by S. algae was investigated at the single-cell level. The focused ion beam-scanning/transmission electron microscopy showed that the passive film underneath the adherent S. algae cell was significantly thinner than that without bacterial coverage after 3 days of inoculation. Atomic force microscopy (AFM) in the nano manipulation mode was used to move the bacterial cell and AFM in the dynamic mode revealed the nanoscale corrosion pit underneath. Peak force tapping-frequency modulation mode of AFM showed high Volta potentials at the pit center and low Volta potentials around the bacterial cell.
materials science, multidisciplinary,metallurgy & metallurgical engineering
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