Optical and nonlinear characterization of Er-doped SnO2 thin films fabricated by thermal evaporation: potential for advanced optical device applications

Sunny Yadav,Anshul Bhardwaj,Sandeep Yadav,Devendra Mohan,Rakesh Dhar
DOI: https://doi.org/10.1007/s10854-024-13625-x
2024-10-08
Journal of Materials Science Materials in Electronics
Abstract:The present work uses the thermal evaporation approach to create various Er-doped SnO 2 thin film compositions. We have conducted thorough optical, morphological, and nonlinear studies using various instrumentation approaches. Utilizing absorption spectra, the indirect and direct bandgaps (Eg) and absorption coefficient ( α ) are calculated. With different Er concentrations, the films' transmission spectra had a visual transmittance range of 80 to 85%. With the aid of a femtosecond laser and the Z-scan technique, the third-order nonlinear optical behavior of Er-doped SnO 2 thin films has been examined. The open and close aperture approach is employed to determine the values of several parameters, including the nonlinear refractive index (n 2 ) along with the nonlinear absorption coefficient ( β ). The numeric values of n 2 , β , and susceptibility χ (3) were found to be in the order of ~ 10 –12 cm 2 /W, ~ 10 –5 cm/W,and ~ 10 −5 esu, respectively. Such nonlinear parameter values demonstrate the potential of thin films for use in optical device applications.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied
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