Investigation of the layer-dependent optical properties of ultrathin BiOI by spectroscopic ellipsometry

Wei Zeng,Liping Feng,Yaochen Yu,Jiaqi Wang,Zhengtang Liu
DOI: https://doi.org/10.1016/j.jallcom.2020.156676
IF: 6.2
2021-01-01
Journal of Alloys and Compounds
Abstract:<p>Layered semiconductor BiOI has gained considerable interests in the field of optoelectronics, but the basic knowledge of its optical and dielectric properties is still lack of a full investigation. Here, by using spectroscopic ellipsometry (SE), the complex refractive indexes and dielectric constants of ultrathin BiOI films over a wide spectral range are measured for the first time. The ellipsometric angle Δ is found to be linear with the layer number of BiOI, suggesting that SE could be a facile way to estimate the thickness of 2D BiOI. The optical properties of BiOI show a distinct layer-dependent feature, and the bandgap values of 2D BiOI increase from 1.99 to 2.33 eV with decreasing thickness. Further, the results from absorption spectrometer also show a blue shift of bandgap energy with decreasing thickness. Our work provides valuable data about the optical properties of ultrathin BiOI, and can shed a light on the exploration of original applications based on 2D BiOI.</p>
materials science, multidisciplinary,chemistry, physical,metallurgy & metallurgical engineering
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