Chemical Environment and Structural Variations in High Entropy Oxide Thin Film Probed with Electron Microscopy

Leixin Miao,Jacob T Sivak,George Kotsonis,Jim Ciston,Colin L Ophus,Ismaila Dabo,Jon-Paul Maria,Susan B Sinnott,Nasim Alem
DOI: https://doi.org/10.1021/acsnano.4c00787
IF: 17.1
2024-06-01
ACS Nano
Abstract:We employ analytical transmission electron microscopy (TEM) to correlate the structural and chemical environment variations within a stacked epitaxial thin film of the high entropy oxide (HEO) Mg(0.2)Co(0.2)Ni(0.2)Cu(0.2)Zn(0.2)O (J14), with two layers grown at different substrate temperatures (500 and 200 °C) using pulsed laser deposition (PLD). Electron diffraction and atomically resolved STEM imaging reveal the difference in out-of-plane lattice parameters in the stacked thin film, which is...
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
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