Abstract:A high‐throughput and high‐resolution powder X‐ray diffractometer has been developed in the third experimental hutch of BL13XU, SPring‐8. The diffractometer is equipped with six sets of 2D CdTe detectors and an automation system including sample exchange and equipment switching. Performance and demonstration results are presented.The demand for powder X‐ray diffraction analysis continues to increase in a variety of scientific fields, as the excellent beam quality of high‐brightness synchrotron light sources enables the acquisition of high‐quality measurement data with high intensity and angular resolution. Synchrotron powder diffraction has enabled the rapid measurement of many samples and various in situ/operando experiments in nonambient sample environments. To meet the demands for even higher throughput measurements using high‐energy X‐rays at SPring‐8, a high‐throughput and high‐resolution powder diffraction system has been developed. This system is combined with six sets of two‐dimensional (2D) CdTe detectors for high‐energy X‐rays, and various automation systems, including a system for automatic switching among large sample environmental equipment, have been developed in the third experimental hutch of the insertion device beamline BL13XU at SPring‐8. In this diffractometer system, high‐brilliance and high‐energy X‐rays ranging from 16 to 72 keV are available. The powder diffraction data measured under ambient and various nonambient conditions can be analysed using Rietveld refinement and the pair distribution function. Using the 2D CdTe detectors with variable sample‐to‐detector distance, three types of scan modes have been established: standard, single‐step and high‐resolution. A major feature is the ability to measure a whole powder pattern with millisecond resolution. Equally important, this system can measure powder diffraction data with high Q exceeding 30 Å−1 within several tens of seconds. This capability is expected to contribute significantly to new research avenues using machine learning and artificial intelligence by utilizing the large amount of data obtained from high‐throughput measurements.

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