The Effect of Shallow Trap Density on the Electrical Characteristics of an Organic Nonvolatile Memory Device Based on Eight-Hydroxyquinoline

Peng Zhang,Yun Guo,Keyang Cao,Mingdong Yi,Liya Huang,Wei Shi,Jintao Zhu,Wei Huang
DOI: https://doi.org/10.1109/ted.2020.3049115
IF: 3.1
2021-03-01
IEEE Transactions on Electron Devices
Abstract:An organic nonvolatile memory is proposed based on the synergistic effect of the (three-aminopropyl) triethoxysilane (APTES) self-assembled monolayer (SAM) and the polystyrene (PS):eight-hydroxyquinoline (8-HQ) blend layer, where 8-HQ is used to provide the trapping sites for the nonvolatile memory, and PS is used to form the matrix for 8-HQ in order to improve the memory property. In addition, the introduced APTES SAM aims to further increase the memory window. Two kinds of PS:8-HQ blend films are adopted, with lower 8-HQ concentration of 50 mg/mL and high spin-coating speed of 5000 rpm to form smooth thin film, while with high 8-HQ concentration of 100 mg/mL and low spin-coating speed of 1000 rpm to form rough thick film. The roughness and the surface modification property of the PS:8-HQ blend film greatly affect the morphology of the active layer, and thus the shallow trap density is also influenced, which further affects the electrical characteristics and memory properties of the nonvolatile memory device. The better characteristics of the memory device with thin 8-HQ layer indicate the potential applications in many domains.
engineering, electrical & electronic,physics, applied
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