Catalyst-Specific Accelerated Stress Tests in Proton Exchange Membrane Low-Temperature Electrolysis for Intermittent Operation

Shaun M Alia,Kimberly S Reeves,Haoran Yu,Jae Hyung Park,Nancy N Kariuki,Kropf Jeremy,Deborah J Myers,David Cullen
DOI: https://doi.org/10.1149/1945-7111/ad2735
IF: 3.9
2024-02-09
Journal of The Electrochemical Society
Abstract:Device-level stress tests are developed that focus on anode catalyst layer degradation and future anticipated operating conditions, including intermittent load and reduced platinum group metal content. Square-wave cycles with an upper load limit of 2.5 A cm‒2 are utilized to screen commercial iridium (Ir) materials. Performance losses are primarily due to decreasing kinetics and are accompanied by catalyst migration into the membrane, worsening catalyst/ionomer integration, and weakening at the catalyst/membrane interface. For ruthenium-containing catalysts, the in-situ performances are higher but durabilities lower than Ir baselines, and any performance advantage is lost within the test. Increased loss is likely due to the higher dissolution rate; microscopy confirmed greater degrees of ruthenium migration. For Ir metal or mixed oxides, ex-situ activity improvements generally did not translate to in-situ performance. The durability, however, is significantly lower and the loss rate increased from 3 (oxide) to 9 (metal) μV cycle‒1. These results are consistent with historical findings in literature, rationalize the continued use of iridium oxide as a baseline catalyst, and demonstrate that traditional catalyst development approaches may not improve device-level durability when focused on low-cost applications. A shift in focus may therefore be more effective at improving catalyst utilization and lessening load requirements.
electrochemistry,materials science, coatings & films
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