Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK

T. Vančura,S. Kičin,T. Ihn,K. Ensslin,M. Bichler,W. Wegscheider
DOI: https://doi.org/10.1063/1.1614836
IF: 4
2003-09-29
Applied Physics Letters
Abstract:A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in a Ga[Al]As heterostructure. At different separations between atomic force microscope tip and sample, a dc voltage is applied between the tip and the electron gas while simultaneously recording the frequency shift of the oscillating tip. Using a plate capacitor model, the local electron density can be extracted from the data. The result coincides within 10% with the data obtained from transport measurements.
physics, applied
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