Cylindrically bent Laue analyzer in an X‐ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers

Nozomu Hiraoka
DOI: https://doi.org/10.1107/s1600577524010634
IF: 2.557
2024-12-08
Journal of Synchrotron Radiation
Abstract:The performances of a spherically bent Bragg analyzer and a cylindrically bent Laue analyzer in an X‐ray Raman/emission spectrometer are compared.The performances of a spherically bent Bragg analyzer and a cylindrically bent Laue analyzer in an X‐ray Raman/emission spectrometer are compared. The reflectivity and energy resolution are evaluated from the intensity of the elastic scattering and the width of the energy distribution on a SiO2 glass sample. Widely used, Bragg analyzers display excellent performance at the photon energy E ≤ 10 keV. However, at higher E, the reflectivity and the resolution gradually deteriorate as E increases, showing poor performance above 20 keV. On the other hand, the reflectivity of the Laue analyzer gradually increases at E > 10 keV, displaying excellent reflectivity and good resolution around 20 keV. The Laue analyzer is suitable for X‐ray absorption spectroscopy in high‐energy‐resolution fluorescence‐detection mode or X‐ray emission spectroscopy on 4d transition metal compounds. Furthermore, the X‐ray Raman features of the lithium K‐edge in LiF and the oxygen K‐edge feature in H2O, measured by nine Bragg analyzers (2 m radius) at E ≃ 9.9 keV and by five Laue analyzers (1.4 m radius) at E ≃ 19.5 keV, have been compared. Similar count rates and resolutions are observed.
optics,physics, applied,instruments & instrumentation
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