Progress toward developing a novel module architecture for increased reliability and reduced costs

K. Barth,Davis Hemenway
DOI: https://doi.org/10.1109/PVSC.2014.6925483
2014-06-08
Abstract:Module reliability has a direct impact on the levalized cost of energy, and reliability issues for thin film PV have been consistently reported. Direct Solar LLC is developing a new module architecture for thin film PV that has robustness to moisture and excellent adhesion under UV light exposure. Process cycle times for each manufacturing step is under 1 minute using low capital cost, small footprint tooling. The patent pending architecture utilizes a specialized two part edge seal. The modules are fabricated without lamination, vacuum pressing or module heating. An initial version of this design has passed IEC 61646 and UL 1703 certification tests and 4500+hrs. of the rigorous 85 C/85% relative humidity “damp heat test”.
Engineering,Environmental Science,Physics
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