High Precision X-ray Measurements 2021

Alessandro Scordo

DOI: https://doi.org/10.3390/condmat7020043

2022-06-11

Condensed Matter

Abstract:High Precision X-ray Measurements 2021 is a Special Issue related to the HPXM2021 conference, held at the INFN Laboratories of Frascati in 2021 [...]

What problem does this paper attempt to address?

Ultrahigh Resolution X-ray Thomson Scattering Measurements at the European XFEL

Thomas Gawne,Zhandos A. Moldabekov,Oliver S. Humphries,Karen Appel,Carsten Bähtz,Victorien Bouffetier,Erik Brambrink,Attila Cangi,Sebastian Göde,Zuzana Konôpková,Mikako Makita,Mikhail Mishchenko,Motoaki Nakatsutsumi,Kushal Ramakrishna,Lisa Randolph,Sebastian Schwalbe,Jan Vorberger,Lennart Wollenweber,Ulf Zastrau,Tobias Dornheim,Thomas R. Preston

2024-05-16

Abstract:Using a novel ultrahigh resolution ($\Delta E \sim 0.1\,$eV) setup to measure electronic features in x-ray Thomson scattering (XRTS) experiments at the European XFEL in Germany, we have studied the collective plasmon excitation in aluminium at ambient conditions, which we can measure very accurately even at low momentum transfers. As a result, we can resolve previously reported discrepancies between ab initio time-dependent density functional theory simulations and experimental observations. The demonstrated capability for high-resolution XRTS measurements will be a game changer for the diagnosis of experiments with matter under extreme densities, temperatures, and pressures, and unlock the full potential of state-of-the-art x-ray free electron laser (XFEL) facilities to study planetary interior conditions, to understand inertial confinement fusion applications, and for material science and discovery.

Plasma Physics
Special Issue "EUV and X-ray Wavefront Sensing"

Mourad Idir,Daniele Cocco,Lei Huang

DOI: https://doi.org/10.3390/s22103940

IF: 3.9

2022-01-01

Sensors

Abstract:X-ray optics are extensively used in synchrotron radiation and free-electron laser facilities, as well as in table-top laboratory sources [...]
2022 HP Special Volume: Interdisciplinary High Pressure Science and Technology

Ho‐kwang Mao,Bin Chen,Huiyang Gou,Kuo Li,Jin Liu,Lin Wang,Hong Xiao,Wenge Yang

DOI: https://doi.org/10.1063/5.0181097

IF: 6.089

2023-01-01

Matter and Radiation at Extremes

Abstract:Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Ho-Kwang Mao, Bin Chen, Huiyang Gou, Kuo Li, Jin Liu, Lin Wang, Hong Xiao, Wenge Yang; 2022 HP special volume: Interdisciplinary high pressure science and technology. Matter Radiat. Extremes 1 October 2023; 8 (6): 063001. https://doi.org/10.1063/5.0181097 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioMatter and Radiation at Extremes Search Advanced Search |Citation Search
Development of a compact HAPG crystal Von Hamos X-ray spectrometer forextended and diffused sources

A. Scordo,C. Curceanu,M. Miliucci,F. Sirghi,J. Zmeskal

DOI: https://doi.org/10.48550/arXiv.1903.02826

2019-03-07

Abstract:Bragg spectroscopy is one of the best established experimental methods for high energy resolution X-ray measurements; however, this technique is limited to the measurement of photons producedfrom well collimated (tens of microns) or point-like sources and becomes quite inefficient for photonscoming from extended and diffused sources. The possibility to perform simultaneous measurementsof several energies is strongly demanded when low rate signals are expected and single angular scansrequire long exposure times. A prototype of a high resolution and high precision X-ray spectrometerworking also with extended isotropic sources, has been developed by the VOXES collaboration atINFN Laboratories of Frascati, using Highly Annealed Pyrolitic Graphite (HAPG) crystals in a semi- Von Hamos configuration, in which the position detector is rotated with respect to thestandard Von Hamos one, to increase the dynamic energy range. The aim is to deliver a cost effectivesystem having an energy resolution at the level of eV for X-ray energies from about 2 keV up to tensof keV, able to perform sub-eV precision measurements with non point-like sources. The proposedspectrometer has possible applications in several fields, going from fundamental physics to quantummechanics tests, synchrotron radiation and X-FEL applications, astronomy, medicine and <a class="link-external link-http" href="http://industry.In" rel="external noopener nofollow">this http URL</a> particular, this technique is fundamental for a series of nuclear physics measurements like, forexample, the energies of the exotic atoms radiative transitions which allow to extract fundamentalparameters in the low energy QCD in the strangeness sector. In this work, the working principleof the spectrometer is presented, together with the tests and the results, in terms of resolution andsource, size obtained for Fe(K\alpha1,2), Cu(K\alpha1,2), Ni(K\beta), Zn(K\alpha1,2), Mo(K\alpha1,2) and Nb(K\beta)lines.

Instrumentation and Detectors,Optics
Towards performing high-resolution inelastic X-ray scattering measurements at hard X-ray free-electron lasers coupled with energetic laser drivers

A Descamps,B K Ofori-Okai,J K Baldwin,Z Chen,L B Fletcher,S H Glenzer,N J Hartley,J B Hasting,D Khaghani,M Mo,B Nagler,V Recoules,R Redmer,M Schörner,P Sun,Y Q Wang,T G White,E E McBride

DOI: https://doi.org/10.1107/S1600577522004453

2022-07-01

Abstract:High-resolution inelastic X-ray scattering is an established technique in the synchrotron community, used to investigate collective low-frequency responses of materials. When fielded at hard X-ray free-electron lasers (XFELs) and combined with high-intensity laser drivers, it becomes a promising technique for investigating matter at high temperatures and high pressures. This technique gives access to important thermodynamic properties of matter at extreme conditions, such as temperature, material sound speed, and viscosity. The successful realization of this method requires the acquisition of many identical laser-pump/X-ray-probe shots, allowing the collection of a sufficient number of photons necessary to perform quantitative analyses. Here, a 2.5-fold improvement in the energy resolution of the instrument relative to previous works at the Matter in Extreme Conditions (MEC) endstation, Linac Coherent Light Source (LCLS), and the High Energy Density (HED) instrument, European XFEL, is presented. Some aspects of the experimental design that are essential for improving the number of photons detected in each X-ray shot, making such measurements feasible, are discussed. A careful choice of the energy resolution, the X-ray beam mode provided by the XFEL, and the position of the analysers used in such experiments can provide a more than ten-fold improvement in the photometrics. The discussion is supported by experimental data on 10 µm-thick iron and 50 nm-thick gold samples collected at the MEC endstation at the LCLS, and by complementary ray-tracing simulations coupled with thermal diffuse scattering calculations.
Foreword to the special virtual issue on X‐ray spectroscopy to understand functional materials: instrumentation, applications, data analysis

Elisa Borfecchia,Kirill A. Lomachenko,Kristina Kvashnina

DOI: https://doi.org/10.1107/s1600577524008695

IF: 2.557

2024-10-23

Journal of Synchrotron Radiation

Abstract:Foreword to the virtual focused issue of Journal of Synchrotron Radiation on X‐ray spectroscopy to understand functional materials: instrumentation, applications, data analysis.Foreword to the virtual focused issue of Journal of Synchrotron Radiation on X‐ray spectroscopy to understand functional materials: instrumentation, applications, data analysis.

optics,physics, applied,instruments & instrumentation
Hard x-ray grazing-incidence ptychography: large field-of-view nanostructure imaging with ultra-high surface sensitivity

P. S. Jørgensen,L. Besley,A. M. Slyamov,A. Diaz,M. Guizar-Sicairos,M. Odstrčil,M. Holler,C. Silvestre,B. Chang,C. Detlefs,J. W. Andreasen

DOI: https://doi.org/10.1364/optica.505478

IF: 10.4

2024-02-03

Optica

Abstract:P. S. Jørgensen, L. Besley, A. M. Slyamov, A. Diaz, M. Guizar-Sicairos, M. Odstrčil, M. Holler, C. Silvestre, B. Chang, C. Detlefs, J. W. Andreasen The morphology and distribution of nanoscale structures, such as catalytic active nanoparticles and quantum dots on surfaces, have a ... [Optica 11, 197-204 (2024)]

optics
Unlocking the Capabilities of Future High-Resolution X-ray Spectroscopy Missions Through Laboratory Astrophysics

Gabriele Betancourt-Martinez,Hiroki Akamatsu,Didier Barret,Manuel Bautista,Sven Bernitt,Stefano Bianchi,Dennis Bodewits,Nancy Brickhouse,Gregory V. Brown,Elisa Costantini,Marcello Coreno,José R. Crespo López-Urrutia,Renata Cumbee,Megan Eckart,Gary Ferland,Fabrizio Fiore,Michael Fogle,Adam Foster,Javier Garcia,Tom Gorczyca,Victoria Grinberg,Nicolas Grosso,Liyi Gu,Ming Feng Gu,Matteo Guainazzi,Natalie Hell,Jan-Willem den Herder,Jelle Kaastra,Timothy Kallman,Julia Lee,Maurice Leutenegger,Joan Marler,Dan McCammon,Shinya Nakashima,Fabrizio Nicastro,Frits Paerels,François Pajot,Etienne Pointecouteau,Delphine Porquet,F. Scott Porter,Daniel Wolf Savin,Makoto Sawada,Chintan Shah,Aurora Simionescu,Monica de Simone,Chad Sosolik,Phillip Stancil,René Steinbrügge,Hiroya Yamaguchi

DOI: https://doi.org/10.48550/arXiv.1903.08213

2019-03-20

Abstract:Thanks to high-resolution and non-dispersive spectrometers onboard future X-ray missions such as XRISM and Athena, we are finally poised to answer important questions about the formation and evolution of galaxies and large-scale structure. However, we currently lack an adequate understanding of many atomic processes behind the spectral features we will soon observe. Large error bars on parameters as critical as transition energies and atomic cross sections can lead to unacceptable uncertainties in the calculations of e.g., elemental abundance, velocity, and temperature. Unless we address these issues, we risk limiting the full scientific potential of these missions. Laboratory astrophysics, which comprises theoretical and experimental studies of the underlying physics behind observable astrophysical processes, is therefore central to the success of these missions.

High Energy Astrophysical Phenomena,Astrophysics of Galaxies
High Resolution X-Ray Scattering Measurements For The Advanced X-Ray Astrophysics Facility (AXAF)

Martin V. Zombeck,Charles C. Wyman,Martin C. Weisskopf

DOI: https://doi.org/10.1117/12.7972860

IF: 1.3

1982-02-01

Optical Engineering

Abstract:The image quality of a high resolution x-ray telescope is determined both by the accuracy to which the optics can be figured and by the smoothness of the reflecting surfaces. The former determines the angular resolution, and the latter, through scattering, affects the fraction of flux within the resolution element. This paper describes a research program designed to enhance the understanding and characterization of x-ray reflecting surfaces with regard to their scattering properties. Included are representative measurements, at the subarcsecond level, of the x-ray scattering from a variety of flat reflectors, and measurements of the surface roughness of a large number of flat reflectors by more traditional methods. This work is part of a technology study for the Advanced X-ray Astrophysics Facility, a near earth-orbiting x-ray observatory to be launched by the Space Shuttle in the late 1980's

optics
High pressure dynamic XAS studies using an energy-dispersive spectrometer

O. Mathon,F. Occelli,E. Lescoute,A. Sollier,P. Loubeyre,W. Helsby,J. Headspith,R. Torchio,I. Kantor,S. Pascarelli

DOI: https://doi.org/10.1080/08957959.2016.1199694

2016-07-02

High Pressure Research

Abstract:We present in this paper recent advances in the high pressure domain provided by the introduction of time-resolved energy-dispersive XAS (EDXAS) techniques at synchrotrons. We highlight technical aspects and describe two modes of acquisition: the ‘movie’ mode, where the time resolution is given by the detector acquisition speed and the ‘pump-and-probe’ mode, where the time resolution is given by the delay between the pump and the probe. These two modes define a frontier in the time resolution, respectively above and below the ∼10 μs regime. In the former, examples of applications are chemical stability and reactions at high pressure and high temperature or probing the warm dense matter regime using rapid current ramps. In the latter, an example is given on studies of dynamically compressed matter, by coupling single-bunch EDXAS at high-brilliance synchrotron to a nanosecond high-power laser.

physics, multidisciplinary
Angular resolution measurements at SPring-8 of a hard X-ray optic for the New Hard X-ray Mission

D. Spiga,L. Raimondi,A. Furuzawa,S. Basso,R. Binda,G. Borghi,V. Cotroneo,G. Grisoni,H. Kunieda,F. Marioni,H. Matsumoto,H. Mori,T. Miyazawa,B. Negri,A. Orlandi,G. Pareschi,B. Salmaso,G. Tagliaferri,K. Uesugi,G. Valsecchi,D. Vernani

DOI: https://doi.org/10.48550/arXiv.1509.03478

2015-09-11

Instrumentation and Methods for Astrophysics

Abstract:The realization of X-ray telescopes with imaging capabilities in the hard (> 10 keV) X-ray band requires the adoption of optics with shallow (< 0.25 deg) grazing angles to enhance the reflectivity of reflective coatings. On the other hand, to obtain large collecting area, large mirror diameters (< 350 mm) are necessary. This implies that mirrors with focal lengths >10 m shall be produced and tested. Full-illumination tests of such mirrors are usually performed with on- ground X-ray facilities, aimed at measuring their effective area and the angular resolution; however, they in general suffer from effects of the finite distance of the X-ray source, e.g. a loss of effective area for double reflection. These effects increase with the focal length of the mirror under test; hence a "partial" full-illumination measurement might not be fully representative of the in-flight performances. Indeed, a pencil beam test can be adopted to overcome this shortcoming, because a sector at a time is exposed to the X-ray flux, and the compensation of the beam divergence is achieved by tilting the optic. In this work we present the result of a hard X-ray test campaign performed at the BL20B2 beamline of the SPring-8 synchrotron radiation facility, aimed at characterizing the Point Spread Function (PSF) of a multilayer-coated Wolter-I mirror shell manufactured by Nickel electroforming. The mirror shell is a demonstrator for the NHXM hard X-ray imaging telescope (0.3 - 80 keV), with a predicted HEW (Half Energy Width) close to 20 arcsec. We show some reconstructed PSFs at monochromatic X-ray energies of 15 to 63 keV, and compare them with the PSFs computed from post-campaign metrology data, self-consistently treating profile and roughness data by means of a method based on the Fresnel diffraction theory. The modeling matches the measured PSFs accurately.
Measurements of K-edge and L-edge extended x-ray absorption fine structure at the national ignition facility (invited)

H Sio,A Krygier,S Stoupin,R E Rudd,S A Bonev,D G Braun,F Coppari,A L Coleman,N Bhandarkar,M Bitter,D K Bradley,J Buscho,J Corbin,M Dozieres,P C Efthimion,J H Eggert,L Gao,K W Hill,S Hamel,W Hsing,B Kozioziemski,B F Kraus,O L Landen,K Le Galloudec,T E Lockard,A Mackinnon,M May,J M McNaney,N Ose,N Pablant,H-S Park,J Riddles,M Sharma,M B Schneider,C Stan,N Thompson,D B Thorn,S Vonhof,Y Ping

DOI: https://doi.org/10.1063/5.0219575

2024-10-01

Abstract:High-energy-density laser facilities and advances in dynamic compression techniques have expanded access to material states in the Terapascal regime relevant to inertial confinement fusion, planetary science, and geophysics. However, experimentally determining the material temperature in these extreme conditions has remained a difficult challenge. Extended X-ray Absorption Fine Structure (EXAFS), referring to the modulations in x-ray absorption above an absorption edge from photoelectrons' interactions with neighboring atoms, has proven to be a versatile and robust technique for probing material temperature and density for mid-to-high Z elements under dynamic compression. The current platform at the National Ignition Facility has developed six configurations for EXAFS measurements between 7 and 18 keV for different absorption edges (Fe K, Co K, Cu K, Ta L3, Pb L3, and Zr K) using a curved-crystal spectrometer and a bright, continuum foil x-ray source. In this work, we describe the platform geometry, x-ray source performance, spectrometer resolution and throughput, design considerations, and data in ambient and dynamic-compression conditions.
Introduction to lateral resolution and analysis area measurements in XPS

Wolfgang E. S. Unger,Jörg M. Stockmann,Mathias Senoner,Thomas Weimann,Sebastian Bütefisch,Cristiana Passiu,Nicholas D. Spencer,Antonella Rossi

DOI: https://doi.org/10.1116/6.0000398

2020-09-01

Abstract:Imaging and small-spot (small area) XPS have become increasingly important components of surface chemical analysis during the last three decades, and its use is growing. Some ambiguity in the use of terminology, understanding of concepts, and lack of appropriate reference materials leads to confusing and not always reproducible data. In this paper, it is shown that by using existing knowledge, appropriate test specimens, and standardized approaches, problems of comparability and such reproducibility issues recently observed for XPS data reported in the scientific literature can be overcome. The standardized methods of ISO 18516:2019, (i) the straight-edge, (ii) the narrow-line, and (iii) the grating method, can be used to characterize and compare the lateral resolution achieved by imaging XPS instruments and are described by reporting examples. The respective measurements are made using new test specimens. When running an XPS instrument in the small-spot (small area) mode for a quantitative analysis of a feature of interest, the question arises as to what contribution to the intensity originates from outside the analysis area. A valid measurement approach to control the intensity from outside the nominal analysis area is also described. As always, the relevant resolution depends on the specific question that needs to be addressed. The strengths and limitations of methods defining resolution are indicated.

physics, applied,materials science, coatings & films
ID20 – opportunities for inelastic X-ray scattering at extreme conditions

Christoph J. Sahle,Sylvain Petitgirard,Georg Spiekermann,Robin Sakrowski,Noora Suomalainen,Florent Gerbon,Jeroen Jacobs,Yves Watier,Christian Sternemann,Marco Moretti Sala,Valerio Cerantola

DOI: https://doi.org/10.1080/08957959.2024.2356523

2024-05-26

High Pressure Research

Abstract:Owing to the availability of bright X-rays sources such as the ESRF-EBS, inelastic X-ray scattering of samples contained in complex sample environments, including high pressure devices, has become feasible. Compared to well-established characterization techniques such as X-ray diffraction or X-ray absorption fine structure spectroscopy, inelastic X-ray scattering of samples under extreme conditions is a relatively novel probe. However, unique information about the electronic, magnetic, and local atomic structure is accessible with inelastic X-ray scattering. Here, capabilities of beamline ID20 of the ESRF in the field of high pressure inelastic X-ray scattering are presented and some recent activities are reviewed.

physics, multidisciplinary
Astro 2020: Astromineralogy of interstellar dust with X-ray spectroscopy

Lia Corrales,Lynne Valencic,Elisa Costantini,Javier Garcia,Efrain Gatuzz,Tim Kallman,Julia Lee,Norbert Schulz,Sascha Zeegers,Claude Canizares,Bruce Draine,Sebastian Heinz,Edmund Hodges-Kluck,Edward B. Jenkins,Frits Paerels,Randall K. Smith,Tea Temim,Joern Wilms,Daniel W. Savin

DOI: https://doi.org/10.48550/arXiv.1904.12790

2019-04-29

Earth and Planetary Astrophysics

Abstract:X-ray absorption fine structure (XAFS) in the 0.2-2 keV band is a crucial component in multi-wavelength studies of dust mineralogy, size, and shape -- parameters that are necessary for interpreting astronomical observations and building physical models across all fields, from cosmology to exoplanets. Despite its importance, many fundamental questions about dust remain open. What is the origin of the dust that suffuses the interstellar medium (ISM)? Where is the missing interstellar oxygen? How does iron, predominantly produced by Type Ia supernovae, become incorporated into dust? What is the main form of carbon in the ISM, and how does it differ from carbon in stellar winds? The next generation of X-ray observatories, employing microcalorimeter technology and $R \equiv \lambda/\Delta \lambda \geq 3000$ gratings, will provide pivotal insights for these questions by measuring XAFS in absorption and scattering. However, lab measurements of mineralogical candidates for astrophysical dust, with R > 1000, are needed to fully take advantage of the coming observations.
Investigation of Nanostructures with X-ray Scattering Techniques

Dominik Kriegner,Milan Dopita

DOI: https://doi.org/10.3390/cryst9100500

2020-04-06

Abstract:The structural investigations of nanomaterials motivated by their large variety and diverse set of applications have attracted considerable attention. In particular, the ever-improving machinery, both in laboratory and at large scale facilities, together with the methodical improvements available for studying nanostructures ranging from epitaxial nanomaterials, nanocrystalline thin films and coatings, to nanoparticles and colloidal nanocrystals allows us to gain a more detailed understanding of their structural properties. As the structure essentially determines the physical properties of the materials, this advances the possibilities of structural studies and also enables a deeper understanding of the structure to property relationships. In this special issue entitled "Investigation of Nanostructures with X-ray Scattering Techniques" five contributions show the recent progress in various research fields. Contributions cover topics as diverse as neutron scattering on magnetic multilayer films, epitaxial orientation of organic thin films, nanoparticle ordering and chemical composition analysis, and the combination of nanofocused X-ray beams with electrical measurements.

Materials Science
High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

K Dudeck,M Couillard,N Gauquelin,L Gunawan,S Hosseini Vajargah,S Lazar,D Rossouw,Y Shao,G Zhu,G Botton

DOI: https://doi.org/10.1017/s1431927611004843

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
In situ high-pressure wide-angle hard x-ray photon correlation spectroscopy: A versatile tool probing atomic dynamics of extreme condition matter

Qiaoshi Zeng

DOI: https://doi.org/10.1063/5.0146660

IF: 6.089

2023-03-08

Matter and Radiation at Extremes

Abstract:With the advent of new synchrotron radiation x-ray sources that provide a significantly enhanced coherent flux, high-energy x-ray photon correlation spectroscopy measurements can be performed on materials in a diamond anvil cell. Essential information on atomic dynamics that was previously inaccessible can be obtained for various novel phenomena emerging under extreme conditions. This article discusses the importance, feasibility, and experimental details of this technique, as well as the opportunities that it offers to address critical scientific challenges.

physics, multidisciplinary
High-accuracy bulk electronic bandmapping with eliminated diffraction effects using hard X-ray photoelectron momentum microscopy

S. Babenkov,K. Medjanik,D. Vasilyev,S. Chernov,C. Schlueter,A. Gloskovskii,Yu. Matveyev,W. Drube,B. Schönhense,K. Rossnagel,H.-J. Elmers,G. Schönhense

DOI: https://doi.org/10.1038/s42005-019-0208-7

2019-09-10

Communications Physics

Abstract:Abstract A key benefit of angle-resolved photoelectron spectroscopy (ARPES) in the X-ray range is the significant increase of the information depth, thanks to the large inelastic mean-free-path of the escaping photoelectrons. In practice hard X-ray ARPES (HARPES) faces severe challenges by low cross sections, large photon momentum transfer, and in particular strong phonon scattering and photoelectron diffraction effects. Here, we show that these challenges can be overcome by extending ultra-efficient time-of-flight momentum microscopy into the hard X-ray regime. Phonon scattering destroys the initial momentum distribution but subsequent diffraction at the lattice imprints a pronounced Kikuchi-type pattern on the background signal. Moreover, the pattern of the valence electrons is modulated by diffraction as well. For the examples of the medium-weight element materials Mo and layered TiTe 2 , we demonstrate how comprehensive valence-band and core-level photoemission data taken under identical conditions can be used to effectively remove photoelectron diffraction effects in HARPES band maps.

physics, multidisciplinary
An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

Aljoša Hafner,Luca Costa,George Kourousias,Valentina Bonanni,Milan Žižić,Andrea Stolfa,Benjamin Bazi,Laszlo Vincze,Alessandra Gianoncelli

DOI: https://doi.org/10.1039/d3an01358h

2024-01-29

Abstract:Multimodal imaging and spectroscopy like concurrent scanning transmission X-ray microscopy (STXM) and X-ray fluorescence (XRF) are highly desirable as they allow retrieving complementary information. This paper reports on the design, development, integration and field testing of a novel in situ atomic force microscopy (AFM) instrument for operation under high vacuum in a synchrotron soft X-ray microscopy STXM-XRF end-station. A combination of μXRF and AFM is demonstrated for the first time in the soft X-ray regime, with an outlook for the full XRF-STXM-AFM combination.

High Precision X-ray Measurements 2021

Ultrahigh Resolution X-ray Thomson Scattering Measurements at the European XFEL

Special Issue "EUV and X-ray Wavefront Sensing"

2022 HP Special Volume: Interdisciplinary High Pressure Science and Technology

Development of a compact HAPG crystal Von Hamos X-ray spectrometer forextended and diffused sources

Towards performing high-resolution inelastic X-ray scattering measurements at hard X-ray free-electron lasers coupled with energetic laser drivers

Foreword to the special virtual issue on X‐ray spectroscopy to understand functional materials: instrumentation, applications, data analysis

Hard x-ray grazing-incidence ptychography: large field-of-view nanostructure imaging with ultra-high surface sensitivity

Unlocking the Capabilities of Future High-Resolution X-ray Spectroscopy Missions Through Laboratory Astrophysics

High Resolution X-Ray Scattering Measurements For The Advanced X-Ray Astrophysics Facility (AXAF)

High pressure dynamic XAS studies using an energy-dispersive spectrometer

Angular resolution measurements at SPring-8 of a hard X-ray optic for the New Hard X-ray Mission

Measurements of K-edge and L-edge extended x-ray absorption fine structure at the national ignition facility (invited)

Introduction to lateral resolution and analysis area measurements in XPS

ID20 – opportunities for inelastic X-ray scattering at extreme conditions

Astro 2020: Astromineralogy of interstellar dust with X-ray spectroscopy

Investigation of Nanostructures with X-ray Scattering Techniques

High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures

In situ high-pressure wide-angle hard x-ray photon correlation spectroscopy: A versatile tool probing atomic dynamics of extreme condition matter

High-accuracy bulk electronic bandmapping with eliminated diffraction effects using hard X-ray photoelectron momentum microscopy

An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline