Special Issue "EUV and X-ray Wavefront Sensing"

Mourad Idir,Daniele Cocco,Lei Huang

DOI: https://doi.org/10.3390/s22103940

IF: 3.9

2022-01-01

Sensors

Abstract:X-ray optics are extensively used in synchrotron radiation and free-electron laser facilities, as well as in table-top laboratory sources [...]

What problem does this paper attempt to address?

EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging.

Ombeline de La Rochefoucauld,Guillaume Dovillaire,Fabrice Harms,Mourad Idir,Lei Huang,Xavier Levecq,Martin Piponnier,Philippe Zeitoun

DOI: https://doi.org/10.3390/s21030874

IF: 3.9

2021-01-01

Sensors

Abstract:For more than 15 years, Imagine Optic have developed Extreme Ultra Violet (EUV) and X-ray Hartmann wavefront sensors for metrology and imaging applications. These sensors are compatible with a wide range of X-ray sources: from synchrotrons, Free Electron Lasers, laser-driven betatron and plasma-based EUV lasers to High Harmonic Generation. In this paper, we first describe the principle of a Hartmann sensor and give some key parameters to design a high-performance sensor. We also present different applications from metrology (for manual or automatic alignment of optics), to soft X-ray source optimization and X-ray imaging.
Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy

Mabel Ruiz-Lopez,Masoud Mehrjoo,Barbara Keitel,Elke Plönjes,Domenico Alj,Guillaume Dovillaire,Lu Li,Philippe Zeitoun

DOI: https://doi.org/10.3390/s20226426

IF: 3.9

2020-11-10

Sensors

Abstract:Wavefront analysis is a fast and reliable technique for the alignment and characterization of optics in the visible, but also in the extreme ultraviolet (EUV) and X-ray regions. However, the technique poses a number of challenges when used for optical systems with numerical apertures (NA) > 0.1. A high-numerical-aperture Hartmann wavefront sensor was employed at the free electron laser FLASH for the characterization of a Schwarzschild objective. These are widely used in EUV to achieve very small foci, particularly for photolithography. For this purpose, Schwarzschild objectives require highly precise alignment. The phase measurements acquired with the wavefront sensor were analyzed employing two different methods, namely, the classical calculation of centroid positions and Fourier demodulation. Results from both approaches agree in terms of wavefront maps with negligible degree of discrepancy.

engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation
X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions

E. Nazaretski,W. Xu,H. Yan,X. Huang,Wei Xu,N. Bouet,J. Zhou,D. S. Coburn,W. -K. Lee,M. Ge,L. Huang,M. Idir,Y. S. Chu,Evgeny Nazaretski,Weihe Xu,Hanfei Yan,Xiaojing Huang,Nathalie Bouet,Juan Zhou,David Scott Coburn,Wah-Keat Lee,Mingyuan Ge,Lei Huang,Mourad Idir,Yong S. Chu

DOI: https://doi.org/10.1117/12.2528166

2019-09-09

Abstract:X-ray microscopy is a mature characterization tool routinely used to answer various questions of science, technology and engineering. The high penetration power of X-rays allows to utilize different characterization methods and reveal elemental composition, crystalline phases, strain distribution, oxidation states etc. in macroscopic and microscopic samples. To obtain comprehensive chemical and structural information at the nanometer scale an X-ray microscope must be equipped with adequate capabilities and allow acquisition of multiple datasets simultaneously. Full-field or scanning X-ray microscopes usually serve this purpose and complement each other. In the recent years, a number of X-ray microscopes have been designed, constructed and commissioned at NSLS-II. In this work we provide an overview of the microscopy instrumentation developments at NSLS-II. It includes the multilayer Laue Lens based nanoprobe optimized for 10 nm spatial resolution imaging, it’s current status and future upgrades; the zone plate based full-field imaging system capable of nano-tomography measurements in less than 1 minute; a laser scanning system optimized for ptychography measurements along with algorithms development, and a new Kirkpatrick-Baez based scanning microscope designed for sub-100 nm spatial resolution experiments.
Three-dimensional coherent diffraction snapshot imaging using extreme ultraviolet radiation from a free electron laser

Danny Fainozzi,Matteo Ippoliti,Fulvio Billè,Dario De Angelis,Laura Foglia,Claudio Masciovecchio,Riccardo Mincigrucci,Matteo Pancaldi,Emanuele Pedersoli,Christian M. Gunther,Bastian Pfau,Michael Schneider,Clemens Von Korff Schmising,Stefan Eisebitt,George Kourousias,Filippo Bencivenga,Flavio Capotondi

2023-04-03

Abstract:The possibility to obtain a three-dimensional representation of a single object with sub-$\mu$m resolution is crucial in many fields, from material science to clinical diagnostics. This is typically achieved through tomography, which combines multiple two-dimensional images of the same object captured at different orientations. However, this serial imaging method prevents single-shot acquisition in imaging experiments at free electron lasers. In the present experiment, we report on a new approach to 3D imaging using extreme-ultraviolet radiation. In this method, two EUV pulses hit simultaneously an isolated 3D object from different sides, generating independent coherent diffraction patterns, resulting in two distinct bidimensional views obtained via phase retrieval. These views are then used to obtain a 3D reconstruction using a ray tracing algorithm. This EUV stereoscopic imaging approach, similar to the natural process of binocular vision, provides sub-$\mu$m spatial resolution and single shot capability. Moreover, ultrafast time resolution and spectroscopy can be readily implemented, a further extension to X-ray wavelengths can be envisioned as well.

Optics,Image and Video Processing,Data Analysis, Statistics and Probability
Progress and prospects in nonlinear extreme-ultraviolet and X-ray optics and spectroscopy

Majed Chergui,Martin Beye,Shaul Mukamel,Cristian Svetina,Claudio Masciovecchio

DOI: https://doi.org/10.1038/s42254-023-00643-7

2023-09-27

Guangxue Jishu/Optical Technique

Abstract:Free-electron lasers and high-harmonic-generation table-top systems are new sources of extreme-ultraviolet to hard X-ray photons, providing ultrashort pulses that are intense, coherent and tunable. They are enabling a broad range of nonlinear optical and spectroscopic methods at short wavelengths, similar to those developed in the terahertz to ultraviolet regimes over the past 60 years. The extreme-ultraviolet to X-ray wavelengths access core transitions that can provide element and orbital selectivity, structural resolution down to the sub-nanometre scale and, for some methods, high momentum transfers across typical Brillouin zones; the possibilities for polarization control and sub-femtosecond time resolution are opening up new frontiers in research. In this Roadmap, we review the emergence of this field over the past 10 years or so, covering methods such as sum or difference frequency generation and second-harmonic generation, two-photon absorption, stimulated emission or Raman spectroscopy and transient grating spectroscopy. We then discuss the unique opportunities provided by these techniques for probing elementary dynamics in a wide variety of systems. New sources of extreme-ultraviolet to hard X-ray photons have enabled a wide range of short-wavelength nonlinear optical and spectroscopic methods over the past decade, and, for the future, offer unique opportunities to probe elementary dynamics in various systems.
Material-specific high-resolution table-top extreme ultraviolet microscopy

Wilhelm Eschen,Lars Loetgering,Vittoria Schuster,Robert Klas,Alexander Kirsche,Lutz Berthold,Michael Steinert,Thomas Pertsch,Herbert Gross,Michael Krause,Jens Limpert,Jan Rothhardt

DOI: https://doi.org/10.48550/arXiv.2112.13046

2021-12-24

Abstract:Microscopy with extreme ultraviolet (EUV) radiation holds promise for high-resolution imaging with excellent material contrast, due to the short wavelength and numerous element-specific absorption edges available in this spectral range. At the same time, EUV radiation has significantly larger penetration depths than electrons. It thus enables a nano-scale view into complex three-dimensional structures that are important for material science, semiconductor metrology, and next-generation nano-devices. Here, we present high-resolution and material-specific microscopy at 13.5 nm wavelength. We combine a highly stable, high photon-flux, table-top EUV source with an interferometrically stabilized ptychography setup. By utilizing structured EUV illumination, we overcome the limitations of conventional EUV focusing optics and demonstrate high-resolution microscopy at a half-pitch lateral resolution of 16 nm. Moreover, we propose mixed-state orthogonal probe relaxation ptychography, enabling robust phase-contrast imaging over wide fields of view and long acquisition times. In this way, the complex transmission of an integrated circuit is precisely reconstructed, allowing for the classification of the material composition of mesoscopic semiconductor systems.

Optics,Applied Physics
Sensing the wavefront of x-ray free-electron lasers using aerosol spheres

N Duane Loh,Dmitri Starodub,Lukas Lomb,Christina Y Hampton,Andrew V Martin,Raymond G Sierra,Anton Barty,Andrew Aquila,Joachim Schulz,Jan Steinbrener,Robert L Shoeman,Stephan Kassemeyer,Christoph Bostedt,John Bozek,Sascha W Epp,Benjamin Erk,Robert Hartmann,Daniel Rolles,Artem Rudenko,Benedikt Rudek,Lutz Foucar,Nils Kimmel,Georg Weidenspointner,Guenter Hauser,Peter Holl,Emanuele Pedersoli,Mengning Liang,Mark S Hunter,Lars Gumprecht,Nicola Coppola,Cornelia Wunderer,Heinz Graafsma,Filipe R N C Maia,Tomas Ekeberg,Max Hantke,Holger Fleckenstein,Helmut Hirsemann,Karol Nass,Thomas A White,Herbert J Tobias,George R Farquar,W Henry Benner,Stefan Hau-Riege,Christian Reich,Andreas Hartmann,Heike Soltau,Stefano Marchesini,Sasa Bajt,Miriam Barthelmess,Lothar Strueder,Joachim Ullrich,Philip Bucksbaum,Matthias Frank,Ilme Schlichting,Henry N Chapman,Michael J Bogan

DOI: https://doi.org/10.1364/OE.21.012385

2013-05-20

Abstract:Characterizing intense, focused x-ray free electron laser (FEL) pulses is crucial for their use in diffractive imaging. We describe how the distribution of average phase tilts and intensities on hard x-ray pulses with peak intensities of 10(21) W/m(2) can be retrieved from an ensemble of diffraction patterns produced by 70 nm-radius polystyrene spheres, in a manner that mimics wavefront sensors. Besides showing that an adaptive geometric correction may be necessary for diffraction data from randomly injected sample sources, our paper demonstrates the possibility of collecting statistics on structured pulses using only the diffraction patterns they generate and highlights the imperative to study its impact on single-particle diffractive imaging.
Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron-ion imaging

Antoine Comby,Etienne Bloch,Sandra Beauvarlet,Debobrata Rajak,Samuel Beaulieu,Dominique Descamps,Aura Gonzalez,Florent Guichard,Stéphane Petit,Yoann Zaouter,Valérie Blanchet,Yann Mairesse

DOI: https://doi.org/10.1088/1361-6455/abbe27

2020-06-11

Abstract:After decades of supremacy of the Titanium:Sapphire technology, Ytterbium-based high-order harmonic sources are emerging as an interesting alternative for experiments requiring high flux of ultrashort extreme ultraviolet (XUV) radiation. In this article we describe a versatile experimental setup delivering XUV photons in the 10-50 eV range. The use of cascaded high-harmonic generation enables us to reach 1.8 mW of average power at 18 eV. Several spectral focusing schemes are presented, to select either a single harmonic or group of high-harmonics and thus an attosecond pulse train. In the perspective of circular dichroism experiments, we produce highly elliptical XUV radiation using resonant elliptical high-harmonic generation, and circularly polarized XUV by bichromatic bicircular high-harmonic generation. As a proof of principle experiment, we focus the XUV beam in a coincidence electron-ion imaging spectrometer, where we measure the photoelectron momentum angular distributions of xenon monomers and dimers.

Optics,Atomic Physics
Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Leora E. Dresselhaus-Marais,Bernard Kozioziemski,Theodor S. Holstad,Trygve Magnus Ræder,Matthew Seaberg,Daewoong Nam,Sangsoo Kim,Sean Breckling,Seonghyuk Choi,Matthieu Chollet,Philip K. Cook,Eric Folsom,Eric Galtier,Arnulfo Gonzalez,Tais Gorhover,Serge Guillet,Kristoffer Haldrup,Marylesa Howard,Kento Katagiri,Seonghan Kim,Sunam Kim,Sungwon Kim,Hyunjung Kim,Erik Bergback Knudsen,Stephan Kuschel,Hae-Ja Lee,Chuanlong Lin,R. Stewart McWilliams,Bob Nagler,Martin Meedom Nielsen,Norimasa Ozaki,Dayeeta Pal,Ricardo Pablo Pedro,Alison M. Saunders,Frank Schoofs,Toshimori Sekine,Hugh Simons,Tim van Driel,Bihan Wang,Wenge Yang,Can Yildirim,Henning Friis Poulsen,Jon H. Eggert

DOI: https://doi.org/10.1038/s41598-023-35526-5

2023-09-06

Abstract:The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

Materials Science
Towards the use of X-ray Free-Electron Laser electron beams to study Quantum Chromo-Dynamics

Eugene Bulyak,Svitozar Serkez,Gianluca Aldo Geloni

2023-09-27

Abstract:X-ray free-electron lasers (XFELs) utilize high-density and high-energy electron bunches which are well-suited to produce Compton back-scattering radiation. Here we study back-scattered radiation pulses produced by the interaction of XFEL electron beams and an optical laser. We discuss cost-effective setups to study such processes, taking advantage of the existing conventional as well as proposed XFEL infrastructure. We estimate parameters of possible experiments and compare them with other projects under construction.

Accelerator Physics,High Energy Physics - Experiment
Highly efficient and aberration-free off-plane grating spectrometer and monochromator for EUV—soft X-ray applications

Jie Li,Kui Li,Xiaoshi Zhang,Dimitar Popmintchev,Hao Xu,Yutong Wang,Ruixuan Li,Guangyin Zhang,Jiyue Tang,Jin Niu,Yongjun Ma,Runyu Meng,Changjun Ke,Jisi Qiu,Yunfeng Ma,Tenio Popmintchev,Zhongwei Fan

DOI: https://doi.org/10.1038/s41377-023-01342-9

2024-01-08

Light Science & Applications

Abstract:We demonstrate a novel flat-field, dual-optic imaging EUV—soft X-ray spectrometer and monochromator that attains an unprecedented throughput efficiency exceeding 60% by design, along with a superb spectral resolution of λ /Δ λ > 200 accomplished without employing variable line spacing gratings. Exploiting the benefits of the conical diffraction geometry, the optical system is globally optimized in multidimensional parameter space to guarantee optimal imaging performance over a broad spectral range while maintaining circular and elliptical polarization states at the first, second, and third diffraction orders. Moreover, our analysis indicates minimal temporal dispersion, with pulse broadening confined within 80 fs tail-to-tail and an FWHM value of 29 fs, which enables ultrafast spectroscopic and pump-probe studies with femtosecond accuracy. Furthermore, the spectrometer can be effortlessly transformed into a monochromator spanning the EUV—soft X-ray spectral region using a single grating with an aberration-free spatial profile. Such capability allows coherent diffractive imaging applications to be conducted with highly monochromatic light in a broad spectral range and extended to the soft X-ray region with minimal photon loss, thus facilitating state-of-the-art imaging of intricate nano- and bio-systems, with a significantly enhanced spatiotemporal resolution, down to the nanometer–femtosecond level.

optics
Ultrahigh Resolution X-ray Thomson Scattering Measurements at the European XFEL

Thomas Gawne,Zhandos A. Moldabekov,Oliver S. Humphries,Karen Appel,Carsten Bähtz,Victorien Bouffetier,Erik Brambrink,Attila Cangi,Sebastian Göde,Zuzana Konôpková,Mikako Makita,Mikhail Mishchenko,Motoaki Nakatsutsumi,Kushal Ramakrishna,Lisa Randolph,Sebastian Schwalbe,Jan Vorberger,Lennart Wollenweber,Ulf Zastrau,Tobias Dornheim,Thomas R. Preston

2024-05-16

Abstract:Using a novel ultrahigh resolution ($\Delta E \sim 0.1\,$eV) setup to measure electronic features in x-ray Thomson scattering (XRTS) experiments at the European XFEL in Germany, we have studied the collective plasmon excitation in aluminium at ambient conditions, which we can measure very accurately even at low momentum transfers. As a result, we can resolve previously reported discrepancies between ab initio time-dependent density functional theory simulations and experimental observations. The demonstrated capability for high-resolution XRTS measurements will be a game changer for the diagnosis of experiments with matter under extreme densities, temperatures, and pressures, and unlock the full potential of state-of-the-art x-ray free electron laser (XFEL) facilities to study planetary interior conditions, to understand inertial confinement fusion applications, and for material science and discovery.

Plasma Physics
Ultrafast Time Resolved X-Ray Diffraction, Extended X-Ray Absorption Fine Structure And X-Ray Absorption Near Edge Structure

Ali Oguz Er,Jie Chen,Peter M. Rentzepis

DOI: https://doi.org/10.1063/1.4738372

IF: 2.877

2012-01-01

Journal of Applied Physics

Abstract:Ultrafast time resolved x-ray absorption and x-ray diffraction have made it possible to measure, in real time, transient phenomena structures and processes induced by optical femtosecond pulses. To illustrate the power of these experimental methods, we present several representative examples from the literature. (I) Time resolved measurements of photon/electron coupling, electron/phonon interaction, pressure wave formation, melting and recrystallization by means of time resolved x-ray diffraction. (II) Ultrafast x-ray absorption, EXAFS, for the direct measurement of the structures and their kinetics, evolved during electron transfer within molecules in liquid phase. (III) XANES experiments that measure directly pathway for the population of high spin states and the study of the operating mechanism of dye activated TiO2 solar cell devices. The construction and use of novel polycapillary x-ray lenses that focus and collimate hard x-rays efficiently are described. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4738372]
High-repetition Rate Table-Top XUV Source with Narrow Linewidth and Long-Term Stability for Time-Resolved Photoemission Spectroscopy

Filchito Renee G. Bagsican,Jacques Hawecker,David Bacon,Xing Zhu,Vivek Pareek,Maria-Carla Lupu,Prajakta Kokate,Harley Suchiang,Michael K.L. Man,Julien Madéo,Keshav M. Dani

DOI: https://doi.org/10.1364/jsapo.2023.23p_a310_5

2023-01-01

Abstract:The emergence of table-top XUV sources has ushered in a new era of multidimensional photoemission spectroscopy that allowed access to the nature and dynamics of excited states in various material systems [1]. Here we pre-sent our XUV source that operates at 2 MHz with very high signal-to-noise, long-term stability, and narrow linewidth that has been instrumental to our recent achievements in understanding exciton physics in 2D semiconductors [2-4].
A new framework for soft X-ray transient gratings

Laura Foglia,Riccardo Mincigrucci,Florian Döring,Danny Fainozzi,Talgat Mamyrbayev,Claudio Masciovecchio,Filippo Bencivenga

DOI: https://doi.org/10.1088/1361-6455/ad4fd0

2024-05-25

Journal of Physics B Atomic Molecular and Optical Physics

Abstract:The capability to use extreme ultraviolet (EUV) light for generating transient gratings (TGs) has enabled the study of thermoelastic and magnetic dynamics at the nanoscale, in thin solid samples and surfaces, without the need of specially modifying them. However, the current mirror-based setup for generating EUV TG limits both its extension to the soft X-ray photon energy range and the attainment of few femtosecond time-resolution. Here we propose to overcome these limitations with an alternative experimental scheme based on diffractive optical elements that has become feasible with the current technology. In addition, some aspects of the discussed setup may facilitate the implementation of the EUV TG approach at table-top high-harmonic generation sources.

optics,physics, atomic, molecular & chemical
Frontiers of Synchrotron Research in Materials Science

University of Wollongong,Chen Kai

DOI: https://doi.org/10.1557/mrs.2016.112

IF: 5

2016-01-01

MRS Bulletin

Abstract:Synchrotron radiation has evolved tremendously in recent decades in sources, instrumentation, and applications in materials studies. This article provides background and an introduction to the state of the art of synchrotron research as it relates to materials research, including an overview of the articles in this MRS Bulletin issue, which focus on Laue microdiffraction, high-energy x-ray diffraction on battery materials, synchrotron radiation in high-pressure research, x-ray dark-field microscopy, and x-ray absorption spectroscopy applied to energy research. The modern approach of displaying diffraction data in reciprocal-space units and the distinction between spectroscopy and diffraction are summarized. Applications and technologies are continuously developing toward technical and optical limits, combining multiple methods for an even brighter future for this field. It is now time for expert groups to begin applying multiple and different kinds of quantum beams, such as neutrons, muons, electrons, and ions, complementary to synchrotron radiation for more efficient and effective characterization of materials.
Transient X‐Ray Absorption Near Edge Structure Spectroscopy Using Broadband Free‐Electron Laser Pulses

Pavle Juranić,Claudio Cirelli,Talgat Mamyrbayev,Yohei Uemura,Joan Vila‐Comamala,Frederico Alves Lima,Camila Bacellar,Philip J. M. Johnson,Eduard Prat,Sven Reiche,Anna Wach,Iuliia Bykova,Victoria Kabanova,Christopher Milne,Christian David

DOI: https://doi.org/10.1002/smtd.202301328

IF: 12.4

2024-03-07

Small Methods

Abstract:A beam‐splitting grating configuration that allows simultaneous measurements of the spectra of the incoming XFEL pulses and transmission XANES, which is crucial for compensating the pulse‐dependent intensity and spectrum fluctuations due to the self‐amplified spontaneous emission (SASE) operation. The implementation of this new methodology is applied on a liquid solution of ammonium iron(III) oxalate jet. A new method for time‐resolved X‐ray absorption near edge structure (XANES) spectroscopy that enables faster data acquisition and requires smaller sample quantities for high‐quality data, thus allowing the analysis of more samples in a shorter time is introduced. The method uses large bandwidth free electron laser pulses to measure laser‐excited XANES spectra in transmission mode. A beam‐splitting grating configuration allows simultaneous measurements of the spectra of the incoming X‐ray Free Electron Laser (XFEL) pulses and transmission XANES, which is crucial for compensating the pulse‐dependent intensity and spectrum fluctuations due to the self‐amplified spontaneous emission operation. The implementation of this new methodology is applied on a liquid solution of ammonium iron(III) oxalate jet and is compared to previous results, showing great improvements in the speed of acquisition and spectral resolution, and the ability to measure a large 2‐D spectral‐time map quickly.

materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
Tracking Attosecond Electronic Coherences Using Phase-Manipulated Extreme Ultraviolet Pulses

Andreas Wituschek,Lukas Bruder,Enrico Allaria,Ulrich Bangert,Marcel Binz,Carlo Callegari,Giulio Cerullo,Paolo Cinquegrana,Luca Gianessi,Miltcho Danailov,Alexander Demidovich,Michele Di Fraia,Marcel Drabbels,Raimund Feifel,Tim Laarmann,Rupert Michiels,Najmeh Sadat Mirian,Marcel Mudrich,Ivaylo Nikolov,Finn H. O'Shea,Giuseppe Penco,Paolo Piseri,Oksana Plekan,Kevin Charles Prince,Andreas Przystawik,Primož Rebernik Ribič,Giuseppe Sansone,Paolo Sigalotti,Simone Spampinati,Carlo Spezzani,Richard James Squibb,Stefano Stranges,Daniel Uhl,Frank Stienkemeier

DOI: https://doi.org/10.1038/s41467-020-14721-2

2020-11-02

Abstract:The recent development of ultrafast extreme ultraviolet (XUV) coherent light sources bears great potential for a better understanding of the structure and dynamics of matter. Promising routes are advanced coherent control and nonlinear spectroscopy schemes in the XUV energy range, yielding unprecedented spatial and temporal resolution. However, their implementation has been hampered by the experimental challenge of generating XUV pulse sequences with precisely controlled timing and phase properties. In particular, direct control and manipulation of the phase of individual pulses within a XUV pulse sequence opens exciting possibilities for coherent control and multidimensional spectroscopy, but has not been accomplished. Here, we overcome these constraints in a highly time-stabilized and phase-modulated XUV-pump, XUV-probe experiment, which directly probes the evolution and dephasing of an inner subshell electronic coherence. This approach, avoiding any XUV optics for direct pulse manipulation, opens up extensive applications of advanced nonlinear optics and spectroscopy at XUV wavelengths.

Atomic Physics,Atomic and Molecular Clusters,Optics,Quantum Physics
Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light

Felix Wiesner,Johann J. Abel,Muhammad Hussain,Vipin Krishna,Alisson R. Cadore,Juan P. G. Felipe,Ana M. Valencia,Martin Wünsche,Julius Reinhard,Marco Gruenewald,Caterina Cocchi,Gerhard G. Paulus,Giancarlo Soavi,Silvio Fuchs

DOI: https://doi.org/10.1002/admi.202400534

IF: 5.4

2024-09-04

Advanced Materials Interfaces

Abstract:Coherence tomography with extreme ultraviolet light (EUV) is applied to different van der Waals heterostructures, which enables a 3D sample reconstruction of encapsulated interfaces with nanoscopic axial resolution. This sets the basis for a new spectroscopy tool that, thanks to the temporal profile of laser‐driven EUV sources, can become an ideal probe of ultrafast processes occurring in opto‐electronic devices. New experimental methods with high out‐of‐plane spatial sensitivity combined with ultrafast temporal resolution can revolutionize the understanding of charge‐ and heat‐transfer dynamics occurring at interfaces. In this work, a step forward is taken in this direction by applying coherence tomography with extreme ultraviolet (EUV) light to different van der Waals heterostructures, which enables a 3D sample reconstruction with nanoscopic axial resolution. Furthermore, the measurements and, more in general, the approach is confirmed by ab initio calculations of the refractive index of layered materials that we compare to existing databases of empirical data. The EUV coherence tomography contrast is estimated in a broad spectral range (photon energy 65 –100 eV). This work sets the basis for the development of a new spectroscopy tool that, thanks to the temporal profile of EUV light sources and the high axial resolution of coherence tomography, can become the ideal probe of ultrafast processes occurring in van der Waals heterostructures and buried nanoscale opto‐electronic devices.

materials science, multidisciplinary,chemistry
Ultrafast Extreme Ultraviolet Photoemission Electron Microscope

Wei Zheng,Pengzuo Jiang,Linfeng Zhang,Yang Wang,Quan Sun,Yunquan Liu,Qihuang Gong,Chengyin Wu

DOI: https://doi.org/10.1063/5.0047076

IF: 1.6

2021-01-01

Review of Scientific Instruments

Abstract:Here, we report our newly built table-top ultrafast extreme ultraviolet (EUV) photoemission electron microscope. The coherent ultrafast EUV light is served by a single order harmonic, which is generated by the interaction between the intense 800-nm femtosecond laser and noble gases in the hollow core fiber. The required order of the harmonic is selected out by a single grating in the off-plane mount and focused on the sample in the ultrahigh vacuum chamber of the photoemission electron microscope. Using metal gold and copper samples, the spatial resolution is calibrated to be better than 50 nm and the energy resolution is calibrated to be better than 300 meV. This microscope provides an advanced tool for studying electron dynamics covering the full Brillouin zone of solid materials with ultrahigh time, space, and energy resolution.

Special Issue "EUV and X-ray Wavefront Sensing"

EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging.

Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy

X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions

Three-dimensional coherent diffraction snapshot imaging using extreme ultraviolet radiation from a free electron laser

Progress and prospects in nonlinear extreme-ultraviolet and X-ray optics and spectroscopy

Material-specific high-resolution table-top extreme ultraviolet microscopy

Sensing the wavefront of x-ray free-electron lasers using aerosol spheres

Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron-ion imaging

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Towards the use of X-ray Free-Electron Laser electron beams to study Quantum Chromo-Dynamics

Highly efficient and aberration-free off-plane grating spectrometer and monochromator for EUV—soft X-ray applications

Ultrahigh Resolution X-ray Thomson Scattering Measurements at the European XFEL

Ultrafast Time Resolved X-Ray Diffraction, Extended X-Ray Absorption Fine Structure And X-Ray Absorption Near Edge Structure

High-repetition Rate Table-Top XUV Source with Narrow Linewidth and Long-Term Stability for Time-Resolved Photoemission Spectroscopy

A new framework for soft X-ray transient gratings

Frontiers of Synchrotron Research in Materials Science

Transient X‐Ray Absorption Near Edge Structure Spectroscopy Using Broadband Free‐Electron Laser Pulses

Tracking Attosecond Electronic Coherences Using Phase-Manipulated Extreme Ultraviolet Pulses

Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light

Ultrafast Extreme Ultraviolet Photoemission Electron Microscope