Abstract:Time-based ADC is gaining popularity in medium-resolution high-speed (GS/s) analog-to-digital conversion, due to its capability to achieve faster conversion rates by scaling the time step T LSB through advanced process technology. The conversion speed (f s ) of an N-bit resolution TDC is primarily dominated by the T LSB , represented by f s $< 1/(2^{\mathrm{N}+1}\times \mathrm{T}_{\text{LSB}})$ . Several methods have been proposed to accelerate the speed by reducing T LSB . The vernier delay line design in [1] produces the T LSB by adjusting delay skew (T d1 -T d2 ). Ref. [2] utilizes phase interpolation to generate multi-phase clock outputs with uniform time intervals (1.375 ps). Additionally, the selective delay tuning cell [4] achieves a 500fs T LSB . These circuit implementations have enabled a significant reduction in T LSB . However, further reducing T LSB in traditional active inverter-based delay line of TDC poses several challenges: 1) The jitter budget of T LSB incorporates the random jitter (RJ) introduced by noise in voltage-to-time converter (VTC) and active delay line, as well as determination jitter (DJ) generated by the power supply ripple. In particular, the jitter budget should satisfy the bit error ratio (BER) requirement in communication system. 2) From the perspective of PVT variation calibration for T LSB , reducing T LSB requires higher calibration accuracy, leading to an increased complexity of the calibration circuit. 3) As the T LSB is reduced, a larger transconductance (gm) of input pair becomes critical for enhancing the precision of the dynamic time comparator. Consequently, this leads to an increase in power consumption, particularly during low slew-rate edge transitions.

An Intrinsically PVT Robust 10-Bit 2.6-Gs/s Dynamic Pipelined ADC with Dual-Path Time-Assisted Residue Generation Scheme

A 14-bit 500MS/s and 1GS/s Configurable Pipelined ADC with Background Calibration

A 14bit 500MS/s 85.62dBc SFDR 66.29dB SNDR SHA-less pipelined ADC with a stable and high-linearity input buffer and aperture-error calibration in 40nm CMOS

A 150 MS/s 10-Bit CMOS Pipelined Subranging ADC with Time Constant Reduction Technique.

A 10-bit 20-Msample/s 49mW CMOS pipelined A/D converter

A 10-bit 30-MS/s 50mW pipelined A/D converter

An 8-Bit 1.5-Gs/s Voltage–Time Hybrid Two-Step ADC with Cross-Coupled Linearized VTC

A 1.2-V 19.2-Mw 10-Bit 30-Ms/s Pipelined ADC in 0.13-Μm CMOS

A 10b 1.25GS/s Residue Post-Amplified Pipelined-SAR ADC with Supply-and-Temperature Stabilized Open-Loop Residue Amplifier.

A 4-Gs/s 6-Bit Single-Channel TDC-Assisted Hybrid ADC Featuring Power Supply Variation Adaptation for Inter-Stage Gain Error

A 5gs/s 38.04db SNDR Single-Channel TDC-Assisted Hybrid ADC with $\lambda/4$ Transmission Line Based Time Quantizer Achieving a PVT Robustness 416.6fs Time Step

A 10bit 100MS/s pipelined ADC with an improved 1.5bit/stage architecture

A 12-bit 400-MS/s SHA-less pipelined ADC

A 400-Ms/s 12-Bit Voltage-Time Hybrid ADC with a Ping-Pong SAR TDC for Speed Enhancement.

A 68.5 Db-Sndr, 12.4-Fj/conv.-step, 100-Ms/s Pipelined-Sar ADC with PVT-enhanced Circuitry

A 27-Mw 10-Bit 125-MSPS Charge Domain Pipelined ADC with a PVT Insensitive Boosted Charge Transfer Circuit

A 10-Bit 2.5-Gs/s Two-Step ADC with Selective Time-Domain Quantization in 28-Nm CMOS

A 10-Bit 250 Msps Charge-Domain Pipelined Adc with Replica Controlled Pvt Insensitive Bct Circuit

An 8-Bit 5-Gs/s Single-Channel Hybrid ADC with a $\lambda$ /4 Transmission Line Based Time Quantizer

A 10 bit 100 MS/s Pipelined A/D Converter Implemented in Digital CMOS Process

A 27mw 10-Bit 125MSPS Charge Domain Pipelined ADC